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M74HC4011B1R PDF预览

M74HC4011B1R

更新时间: 2024-11-24 22:57:55
品牌 Logo 应用领域
意法半导体 - STMICROELECTRONICS 解码器驱动器锁存器逻辑集成电路光电二极管
页数 文件大小 规格书
13页 271K
描述
BCD TO 7 SEGMENT LATCH/DECODER DRIVER

M74HC4011B1R 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:DIP
包装说明:DIP, DIP16,.3针数:16
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.77
Is Samacsys:N系列:HC/UH
输入调节:LATCHEDJESD-30 代码:R-PDIP-T16
JESD-609代码:e3逻辑集成电路类型:SEVEN SEGMENT DECODER/DRIVER
功能数量:1端子数量:16
最高工作温度:85 °C最低工作温度:-40 °C
输出极性:TRUE封装主体材料:PLASTIC/EPOXY
封装代码:DIP封装等效代码:DIP16,.3
封装形状:RECTANGULAR封装形式:IN-LINE
峰值回流温度(摄氏度):NOT SPECIFIED电源:2/6 V
传播延迟(tpd):320 ns认证状态:Not Qualified
座面最大高度:5.1 mm子类别:Decoder/Drivers
最大供电电压 (Vsup):6 V最小供电电压 (Vsup):2 V
表面贴装:NO技术:CMOS
温度等级:INDUSTRIAL端子面层:Matte Tin (Sn)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:7.62 mmBase Number Matches:1

M74HC4011B1R 数据手册

 浏览型号M74HC4011B1R的Datasheet PDF文件第2页浏览型号M74HC4011B1R的Datasheet PDF文件第3页浏览型号M74HC4011B1R的Datasheet PDF文件第4页浏览型号M74HC4011B1R的Datasheet PDF文件第5页浏览型号M74HC4011B1R的Datasheet PDF文件第6页浏览型号M74HC4011B1R的Datasheet PDF文件第7页 
M54HC4511  
M74HC4511  
BCD TO 7 SEGMENT LATCH/DECODER DRIVER  
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HIGH SPEED  
tPD = 28 ns (TYP.) AT VCC = 5 V  
LOW POWER DISSIPATION  
ICC = 4 µA (MAX.) AT TA = 25 °C  
HIGH NOISE IMMUNITY  
VNIH = VNIL = 28 % VCC (MIN.)  
OUTPUT DRIVE CAPABILITY  
10 LSTTL LOADS  
HIGH SOURGE CURRENT  
|IOH| = 20 mA (MIN.)  
BALANCED PROPAGATION DELAYS  
tPLH = tPHL  
WIDE OPERATING VOLTAGE RANGE  
B1R  
(Plastic Package)  
F1R  
(Ceramic Package)  
M1R  
(Micro Package)  
C1R  
(Chip Carrier)  
VCC (OPR) = 2 V TO 6 V  
PIN AND FUNCTION COMPATIBLE  
WITH 4511B  
ORDER CODES :  
M54HC4011F1R  
M74HC4011B1R  
M74HC4011M1R  
M74HC4011C1R  
PIN CONNECTIONS (top view)  
DESCRIPTION  
The M54/74HC4511 is a high speed CMOS BCD-  
TO-7 SEGMENT LATCH/DECODER/DRIVER fab-  
ricated with silicon gate C2MOS technology. It  
enables high speed latch anddecode operation with  
identical pin connection and function to standard  
CMOS 4511B.  
The segment output driver, which is CMOS fabri-  
cated in silicon gate C2MOS technology, has large  
IOH capability which enables common cathode Leds  
to be directly driven.  
When lamp test (LT) is taken ”L”, all segment out-  
puts will go to ”H”, and when blanking (BI) is taken  
”L” and LT is taken ”H” all segment outputs will go  
to ”L”.  
These functions operate regardless of other inputs  
and are used to test the display.  
Input BI is used to pulse-modulate the brightness of  
the display.  
When an error input code (over 10) is applied to the  
BCD input, all segment outputs will go ”L” (turn off).  
NC =  
No Internal  
Connection  
All inputs are equipped with protection circuits  
against static discharge and transient excess volt-  
age.  
February 1993  
1/13  

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