5秒后页面跳转
KM718V889-67 PDF预览

KM718V889-67

更新时间: 2024-11-14 21:11:27
品牌 Logo 应用领域
三星 - SAMSUNG 静态存储器内存集成电路
页数 文件大小 规格书
15页 427K
描述
Cache SRAM, 256KX18, 3.8ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100

KM718V889-67 技术参数

生命周期:Obsolete零件包装代码:QFP
包装说明:LQFP,针数:100
Reach Compliance Code:unknownECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.84
最长访问时间:3.8 ns其他特性:SELF TIMED WRITE CYCLE; BYTE WRITE
JESD-30 代码:R-PQFP-G100长度:20 mm
内存密度:4718592 bit内存集成电路类型:CACHE SRAM
内存宽度:18功能数量:1
端口数量:1端子数量:100
字数:262144 words字数代码:256000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:256KX18
输出特性:3-STATE可输出:YES
封装主体材料:PLASTIC/EPOXY封装代码:LQFP
封装形状:RECTANGULAR封装形式:FLATPACK, LOW PROFILE
并行/串行:PARALLEL认证状态:Not Qualified
座面最大高度:1.6 mm最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3.135 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子形式:GULL WING
端子节距:0.65 mm端子位置:QUAD
宽度:14 mmBase Number Matches:1

KM718V889-67 数据手册

 浏览型号KM718V889-67的Datasheet PDF文件第2页浏览型号KM718V889-67的Datasheet PDF文件第3页浏览型号KM718V889-67的Datasheet PDF文件第4页浏览型号KM718V889-67的Datasheet PDF文件第5页浏览型号KM718V889-67的Datasheet PDF文件第6页浏览型号KM718V889-67的Datasheet PDF文件第7页 
KM718V889  
256Kx18 Synchronous SRAM  
Document Title  
256Kx18-Bit Synchronous Pipelined Burst SRAM  
Revision History  
REMARK  
Rev. No. History  
Draft Date  
Preliminary  
Preliminary  
Preliminary  
Preliminary  
0.0  
0.1  
0.2  
0.3  
Initial draft  
May . 15. 1997  
Change 7.5 bin to 7.2  
January . 13 . 1998  
February. 02. 1998  
Change speed symbol 6.0/6.7/7.2/8.5 to 60/67/72/85  
Change DC characteristics VDD condition from VDD=3.3V+10%/-5% Change February. 12. 1998  
Input/output leackage currant for ±1mA to ±2mA  
Modify Read timing & Power down cycle timing.  
Change ISB2 value from 30mA to 20mA.  
Remove DC characteristics ISB1 - L ver.& ISB2 - L ver .  
Remove Low power version.  
Preliminary  
0.4  
Change Undershoot spec  
April. 14. 1998  
from -3.0V(pulse width£20ns) to -2.0V(pulse width£tCYC/2)  
Add Overshoot spec 4.6V((pulse width£tCYC/2)  
Change VIH max from 5.5V to VDD+0.5V  
Preliminary  
Preliminary  
0.5  
0.6  
Change ISB2 value from 20mA to 30mA.  
Change VDD condition from VDD=3.3V+10%/-5% to VDD=3.3V+0.3V/-0.165V.  
May.13. 1998  
May.14. 1998  
Modify DC characteristics( Input Leakage Current test Conditions)  
form VDD=VSS to VDD to Max.  
Final  
Final  
Final  
1.0  
2.0  
3.0  
Final spec Release  
May 15. 1998  
Oct. 23. 1998  
Feb.10. 1999  
Add 119BGA(7x17 Ball Grid Array Package) .  
Remove 119BGA(7x17 Ball Grid Array Package) .  
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the  
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-  
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.  
Feb. 1999  
Rev 3.0  
- 1 -  

与KM718V889-67相关器件

型号 品牌 获取价格 描述 数据表
KM718V889-72 SAMSUNG

获取价格

Cache SRAM, 256KX18, 4ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100
KM718V889-85 SAMSUNG

获取价格

Cache SRAM, 256KX18, 4ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100
KM718V890-10 SAMSUNG

获取价格

Cache SRAM, 256KX18, 5ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100
KM718V890-72 SAMSUNG

获取价格

Cache SRAM, 256KX18, 4.5ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100
KM718V890-85 SAMSUNG

获取价格

Cache SRAM, 256KX18, 5ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100
KM718V895T-60 SAMSUNG

获取价格

Cache SRAM, 256KX18, 3.5ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100
KM718V895T67 SAMSUNG

获取价格

256KX18 CACHE SRAM, 3.8ns, PQFP100, 20 X 14 MM, TQFP-100
KM718V895T72 SAMSUNG

获取价格

256KX18 CACHE SRAM, 4ns, PQFP100, 20 X 14 MM, TQFP-100
KM718V947-7 SAMSUNG

获取价格

SRAM
KM718V947-9 SAMSUNG

获取价格

ZBT SRAM, 512KX18, 9ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100