是否无铅: | 不含铅 | 是否Rohs认证: | 符合 |
生命周期: | Obsolete | Reach Compliance Code: | unknown |
风险等级: | 5.84 | 最长访问时间: | 0.3 ns |
最大时钟频率 (fCLK): | 533 MHz | I/O 类型: | COMMON |
交错的突发长度: | 8 | JESD-30 代码: | R-PBGA-B78 |
JESD-609代码: | e1 | 内存密度: | 1073741824 bit |
内存集成电路类型: | DDR DRAM | 内存宽度: | 8 |
湿度敏感等级: | 3 | 端子数量: | 78 |
字数: | 134217728 words | 字数代码: | 128000000 |
组织: | 128MX8 | 输出特性: | 3-STATE |
封装主体材料: | PLASTIC/EPOXY | 封装代码: | FBGA |
封装等效代码: | BGA78,9X13,32 | 封装形状: | RECTANGULAR |
封装形式: | GRID ARRAY, FINE PITCH | 峰值回流温度(摄氏度): | 260 |
电源: | 1.5 V | 认证状态: | Not Qualified |
刷新周期: | 8192 | 连续突发长度: | 8 |
子类别: | DRAMs | 最大压摆率: | 0.145 mA |
标称供电电压 (Vsup): | 1.5 V | 表面贴装: | YES |
技术: | CMOS | 端子面层: | Tin/Silver/Copper (Sn/Ag/Cu) |
端子形式: | BALL | 端子节距: | 0.8 mm |
端子位置: | BOTTOM | 处于峰值回流温度下的最长时间: | NOT SPECIFIED |
Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
K4B1G0846F-HCF8T | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.3ns, CMOS, PBGA78, | |
K4B1G0846F-HCH9 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.255ns, CMOS, PBGA78, | |
K4B1G0846F-HCH9T | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.255ns, CMOS, PBGA78, | |
K4B1G0846F-HCK0 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.225ns, CMOS, PBGA78, | |
K4B1G0846F-HCK0T | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.225ns, CMOS, PBGA78, | |
K4B1G0846F-HYF8 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.3ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78 | |
K4B1G0846F-HYF80 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.3ns, CMOS, PBGA78 | |
K4B1G0846F-HYF8T | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.3ns, CMOS, PBGA78 | |
K4B1G0846F-HYH9 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.255ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78 | |
K4B1G0846F-HYH90 | SAMSUNG |
获取价格 |
DDR DRAM, 128MX8, 0.255ns, CMOS, PBGA78 |