GAL16V8Z
GAL16V8ZD
Zero Power E2CMOS PLD
Functional Block Diagram
Features
I/CLK
• ZERO POWER E2CMOS TECHNOLOGY
— 100µA Standby Current
CLK
— Input Transition Detection on GAL16V8Z
— Dedicated Power-down Pin on GAL16V8ZD
— Input and Output Latching During Power Down
• HIGH PERFORMANCE E2CMOS TECHNOLOGY
— 12 ns Maximum Propagation Delay
— Fmax = 83.3 MHz
— 8 ns Maximum from Clock Input to Data Output
— TTL Compatible 16 mA Output Drive
— UltraMOS® Advanced CMOS Technology
• E2 CELL TECHNOLOGY
— Reconfigurable Logic
— Reprogrammable Cells
— 100% Tested/100% Yields
— High Speed Electrical Erasure (<100ms)
— 20 Year Data Retention
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
8
8
OLMC
I
OLMC
OLMC
OLMC
OLMC
OLMC
OLMC
OLMC
I
8
8
8
8
8
8
I/DPP
I
I
I
I
I
• EIGHT OUTPUT LOGIC MACROCELLS
— Maximum Flexibility for Complex Logic Designs
— Programmable Output Polarity
— Architecturally Similar to Standard GAL16V8
• PRELOAD AND POWER-ON RESET OF ALL REGISTERS
— 100% Functional Testability
• APPLICATIONS INCLUDE:
— Battery Powered Systems
— DMA Control
— State Machine Control
— High Speed Graphics Processing
I/O/Q
I/OE
OE
• ELECTRONIC SIGNATURE FOR IDENTIFICATION
Description
Pin Configuration
The GAL16V8Z and GAL16V8ZD, at 100 µA standby current and
12ns propagation delay provides the highest speed and lowest
DESCRIPTION
DIP/SOIC
power combination PLD available in the market. The GAL16V8Z/
ZD is manufactured using Lattice Semiconductor's advanced zero
power E2CMOS process, which combines CMOS with Electrically
Erasable (E2) floating gate technology.
PLCC
I/CLK
1
2 0
19
V c c
2
I
I
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
3
1
1 9
18 I/O/Q
GAL
The GAL16V8Z uses Input Transition Detection (ITD) to put the
device in standby mode and is capable of emulating the full func-
tionality of the standard GAL16V8. The GAL16V8ZD utilizes a
dedicated power-down pin (DPP) to put the device in standby mode.
It has 15 inputs available to the AND array.
3
4
5
18
17
I/DPP
4
6
8
16V8Z
I/DPP
GAL16V8Z
I
I
I
I/O/Q
I/O/Q
I/O/Q
16V8ZD 16
I
GAL16V8ZD
Top View
1 6
I
1 5
14
6
7
I
Unique test circuitry and reprogrammable cells allow completeAC,
DC, and functional testing during manufacture. As a result,
Lattice Semiconductor delivers 100% field programmability and
functionality of all GAL products. In addition, 100 erase/write cycles
and data retention in excess of 20 years are specified.
I
I
13
8
9
I
1 4 I/O/Q
1 3
9
1 1
12
G N D
10
1 1
I/OE
Copyright © 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
December 1997
16v8zzd_03
1