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FQA6N80_F109 PDF预览

FQA6N80_F109

更新时间: 2024-11-06 21:16:55
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 局域网开关脉冲晶体管
页数 文件大小 规格书
8页 794K
描述
Power Field-Effect Transistor, 6.3A I(D), 800V, 1.95ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, ROHS COMPLIANT, TO-3PN, 3 PIN

FQA6N80_F109 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:TO-3PN包装说明:FLANGE MOUNT, R-PSFM-T3
针数:3Reach Compliance Code:unknown
风险等级:5.84雪崩能效等级(Eas):680 mJ
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:800 V
最大漏极电流 (Abs) (ID):6.3 A最大漏极电流 (ID):6.3 A
最大漏源导通电阻:1.95 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-30 代码:R-PSFM-T3元件数量:1
端子数量:3工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:FLANGE MOUNT
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):185 W最大脉冲漏极电流 (IDM):25.2 A
认证状态:Not Qualified子类别:FET General Purpose Power
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

FQA6N80_F109 数据手册

 浏览型号FQA6N80_F109的Datasheet PDF文件第2页浏览型号FQA6N80_F109的Datasheet PDF文件第3页浏览型号FQA6N80_F109的Datasheet PDF文件第4页浏览型号FQA6N80_F109的Datasheet PDF文件第5页浏览型号FQA6N80_F109的Datasheet PDF文件第6页浏览型号FQA6N80_F109的Datasheet PDF文件第7页 
September 2007  
®
QFET  
FQA6N80_F109  
800V N-Channel MOSFET  
Features  
Description  
6.3A, 800V, RDS(on) = 1.95@VGS = 10 V  
Low gate charge ( typical 31 nC)  
Low Crss ( typical 14pF)  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
RoHS compliant  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These devices are well suited for high  
efficient switched mode power supplies, active power factor  
correction, electronic lamp ballast based on half bridge  
topology.  
D
G
TO-3PN  
FQA Series  
G D S  
S
Absolute Maximum Ratings  
Symbol  
Parameter  
FQA6N80_F109  
Units  
V
VDSS  
ID  
Drain-Source Voltage  
800  
6.3  
Drain Current  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
- Pulsed  
A
4.0  
A
(Note 1)  
IDM  
Drain Current  
25.2  
± 30  
680  
A
VGSS  
EAS  
IAR  
Gate-Source Voltage  
V
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
6.3  
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
Power Dissipation (TC = 25°C)  
18.5  
4.0  
mJ  
V/ns  
W
185  
- Derate above 25°C  
1.47  
-55 to +150  
W/°C  
°C  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
Maximum lead temperature for soldering purposes,  
1/8" from case for 5 seconds  
300  
°C  
Thermal Characteristics  
Symbol  
Parameter  
Typ  
Max  
0.68  
--  
Units  
°C/W  
°C/W  
°C/W  
RθJC  
RθCS  
RθJA  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Case-to-Sink  
--  
0.24  
--  
Thermal Resistance, Junction-to-Ambient  
40  
©2007 Fairchild Semiconductor Corporation  
FQA6N80_F109 Rev. A  
1
www.fairchildsemi.com  

FQA6N80_F109 替代型号

型号 品牌 替代类型 描述 数据表
FQA7N80C_F109 FAIRCHILD

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800V N-Channel MOSFET

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