DATA SHEET
www.onsemi.com
Silicon Carbide (SiC)
Schottky Diode – EliteSiC,
6ꢀA, 650 V, D2, TO-220-2L
ELECTRICAL CONNECTION
FFSP0665B
1. Cathode
2. Anode
Silicon Carbide (SiC) Schottky Diodes use a completely new
technology that provides superior switching performance and higher
reliability compared to Silicon. No reverse recovery current,
temperature independent switching characteristics, and excellent
thermal performance sets Silicon Carbide as the next generation of
power semiconductor. System benefits include highest efficiency,
faster operating frequency, increased power density, reduced EMI, and
reduced system size and cost.
1
2
Features
TO−220−2LD
CASE 340BB
• Max Junction Temperature 175°C
• Avalanche Rated 26 mJ
• High Surge Current Capacity
• Positive Temperature Coefficient
• Ease of Paralleling
MARKING DIAGRAM
• No Reverse Recovery / No Forward Recovery
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
FFSP
0665B
AYWWZZ
Applications
• General Purpose
• SMPS, Solar Inverter, UPS
• Power Switching Circuit
ABSOLUTE MAXIMUM RATINGS
(T = 25°C, Unless otherwise specified)
C
FFSP0665B
A
YWW
ZZ
= Specific Device Code
= Assembly Site
= Date Code (Year & Week)
= Lot Code
Symbol
Parameter
Value
650
26
Unit
V
V
RRM
Peak Repetitive Reverse Voltage
Single Pulse Avalanche Energy (Note 1)
Continuous Rectified Forward Current
E
AS
mJ
A
I
F
6.0
@ T < 150°C
C
Continuous Rectified Forward Current
8.0
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
@ T < 135°C
C
I
Non−Repetitive
Peak Forward
Surge Current
473
408
28
A
A
T
T
= 25°C, 10 ms
= 150°C, 10 ms
F, Max
C
C
I
Non−Repetitive
Forward
Surge Current
Half−Sine Pulse,
t = 8.3 ms
F, SM
p
P
tot
Power Dissipation
T
T
= 25°C
49
8.3
W
C
= 150°C
C
T , T
Operating and Storage Temperature
Range
−55 to +175
°C
J
STG
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
1. E of 26 mJ is based on starting T = 25°C, L = 0.5 mH, I = 10.2 A, V = 50 V.
AS
J
AS
© Semiconductor Components Industries, LLC, 2019
1
Publication Order Number:
January, 2023 − Rev. 3
FFSP0665B/D