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DAC161P997-DIE_15

更新时间： 2024-09-16 01:10:35
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德州仪器 - TI /
页数 文件大小 规格书
5页 103K
描述
Single-Wire 16-Bit DAC

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DAC161P997-DIE  
www.ti.com  
SLAS940 –MARCH 2013  
Single-Wire 16-Bit DAC  
Check for Samples: DAC161P997-DIE  
1
FEATURES  
2
•
•
•
•
•
•
•
•
•
16-Bit Linearity  
APPLICATIONS  
Single-Wire Interface (SWIF) With Handshake  
Digital Data Transmission (No Loss of Fidelity)  
Pin Programmable Power-Up Condition  
Self Adjusting to Input Data Rate  
•
•
•
•
•
•
•
•
Current Loop Transmitter  
Industrial Process Control  
Actuator Control  
Factory Automation  
Building Automation  
Precision Instruments  
Data Acquisition Systems  
Test Systems  
Loop Error Detection and Reporting  
Programmable Output Current Error Level  
No External Precision Components  
Simple Interface to HART Modulator  
DESCRIPTION  
The DAC161P997-DIE is a 16- bit ∑Δ digital-to-analog converter (DAC) for transmitting an analog output current.  
The data link to the DAC161P997-DIE is a single wire interface (SWIF) which allows sensor data to be  
transferred in digital format over an isolation boundary using  
a single isolation component. The  
DAC161P997-DIE’s digital input is compatible with standard isolation transformers and optocouplers. Error  
detection and handshaking features within the SWIF protocol ensure error free communication across the  
isolation boundary. For applications where isolation is not required, the DAC161P997-DIE interfaces directly to a  
microcontroller.  
The loop drive of the DAC161P997-DIE interfaces to a highway addressable remote transducer (HART)  
modulator, allowing injection of FSK modulated digital data into the current loop. This combination of  
specifications and features makes the DAC161P997-DIE ideal for 2- and 4-wire industrial transmitters.  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
DAC161P997TDA1  
DAC161P997TDA2  
324  
10  
DAC161P997  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2013, Texas Instruments Incorporated  
12345

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