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74LVC1G10 PDF预览

74LVC1G10

更新时间: 2024-11-20 05:05:51
品牌 Logo 应用领域
恩智浦 - NXP /
页数 文件大小 规格书
14页 77K
描述
Single 3-input NAND gate

74LVC1G10 数据手册

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74LVC1G10  
Single 3-input NAND gate  
Rev. 01 — 2 October 2007  
Product data sheet  
1. General description  
The 74LVC1G10 provides a low-power, low-voltage single 3-input NAND gate.  
The inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of  
this device in a mixed 3.3 V and 5 V environment.  
Schmitt trigger action at all inputs makes the circuit tolerant to slower input rise and fall  
time.  
This device is fully specified for partial power-down applications using IOFF  
.
The IOFF circuitry disables the output, preventing the damaging backflow current through  
the device when it is powered down.  
2. Features  
Wide supply voltage range from 1.65 V to 5.5 V  
High noise immunity  
Complies with JEDEC standard:  
JESD8-7 (1.65 V to 1.95 V)  
JESD8-5 (2.3 V to 2.7 V)  
JESD8-B/JESD36 (2.7 V to 3.6 V).  
±24 mA output drive (VCC = 3.0 V)  
CMOS low power consumption  
Latch-up performance exceeds 250 mA  
Direct interface with TTL levels  
Inputs accept voltages up to 5 V  
ESD protection:  
HBM JESD22-A114E exceeds 2000 V  
MM JESD22-A115-A exceeds 200 V  
CDM JESD22-C101-C exceeds 1000 V  
Multiple package options  
Specified from 40 °C to +85 °C and 40 °C to +125 °C  

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