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2SK3320-BL PDF预览

2SK3320-BL

更新时间: 2024-11-18 13:01:11
品牌 Logo 应用领域
东芝 - TOSHIBA 音频放大器
页数 文件大小 规格书
5页 589K
描述
TRANSISTOR 2 CHANNEL, N-CHANNEL, Si, SMALL SIGNAL, JFET, ULTRA SUPER MINI, 2-2L1B, USV, 5 PIN, FET General Purpose Small Signal

2SK3320-BL 技术参数

生命周期:Active包装说明:SMALL OUTLINE, R-PDSO-G5
针数:5Reach Compliance Code:unknown
HTS代码:8541.21.00.95风险等级:5.26
其他特性:LOW NOISE配置:COMMON SOURCE, 2 ELEMENTS
FET 技术:JUNCTIONJESD-30 代码:R-PDSO-G5
JESD-609代码:e0元件数量:2
端子数量:5工作模式:DEPLETION MODE
最高工作温度:125 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):0.2 W
认证状态:Not Qualified子类别:Other Transistors
表面贴装:YES端子面层:TIN LEAD
端子形式:GULL WING端子位置:DUAL
晶体管应用:AMPLIFIER晶体管元件材料:SILICON
Base Number Matches:1

2SK3320-BL 数据手册

 浏览型号2SK3320-BL的Datasheet PDF文件第2页浏览型号2SK3320-BL的Datasheet PDF文件第3页浏览型号2SK3320-BL的Datasheet PDF文件第4页浏览型号2SK3320-BL的Datasheet PDF文件第5页 
2SK3320  
TOSHIBA Field Effect Transistor Silicon N Channel Junction Type  
2SK3320  
For Low Noise Audio Amplifier Applications  
Unit: mm  
Two devices in a ultra super mini (five pins) package  
High |Y |: |Y | = 15 mS (typ.) (V = 10 V, V = 0)  
fs  
fs  
DS  
GS  
High breakdown voltage: V  
= 50 V  
GDS  
Super low noise: NF = 1.0dB (typ.)  
(V  
DS  
= 10 V, I = 0.5 mA, f = 1 kHz, R = 1 k)  
D
G
High input impedance: I  
= 1 nA (max) (V  
= 30 V)  
GSS  
GS  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 common)  
Characteristics  
Gate-drain voltage  
Symbol  
Rating  
Unit  
V
50  
V
GDS  
Gate current  
I
10  
mA  
G
P
D
Drain power dissipation  
200  
mW  
JEDEC  
JEITA  
(Note 1)  
Junction temperature  
T
125  
°C  
°C  
j
TOSHIBA  
2-2L1B  
Storage temperature range  
T
stg  
55~125  
Weight: 6.2 mg (typ.)  
Note:  
Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating  
Marking  
Pin Assignment (top view)  
1
2007-11-01  

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