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2SJ168TE85L PDF预览

2SJ168TE85L

更新时间: 2024-11-24 14:50:07
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
5页 312K
描述
TRANSISTOR 200 mA, 60 V, P-CHANNEL, Si, SMALL SIGNAL, MOSFET, TO-236, FET General Purpose Small Signal

2SJ168TE85L 技术参数

生命周期:Obsolete包装说明:SMALL OUTLINE, R-PDSO-G3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.21.00.95风险等级:5.37
配置:SINGLE最小漏源击穿电压:60 V
最大漏极电流 (ID):0.2 A最大漏源导通电阻:2 Ω
FET 技术:METAL-OXIDE SEMICONDUCTOR最大反馈电容 (Crss):22 pF
JEDEC-95代码:TO-236JESD-30 代码:R-PDSO-G3
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE极性/信道类型:P-CHANNEL
认证状态:Not Qualified表面贴装:YES
端子形式:GULL WING端子位置:DUAL
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

2SJ168TE85L 数据手册

 浏览型号2SJ168TE85L的Datasheet PDF文件第2页浏览型号2SJ168TE85L的Datasheet PDF文件第3页浏览型号2SJ168TE85L的Datasheet PDF文件第4页浏览型号2SJ168TE85L的Datasheet PDF文件第5页 
2SJ168  
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type  
2SJ168  
High Speed Switching Applications  
Unit: mm  
Analog Switch Applications  
Interface Applications  
Excellent switching time: t = 14 ns (typ.)  
on  
High forward transfer admittance: |Y | = 100 mS (min)  
fs  
@I = 50 mA  
D
Low on resistance: R  
= 1.3 (typ.) @ I = 50 mA  
DS (ON) D  
Enhancement-mode  
Complementary to 2SK1062  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
V
60  
±20  
V
V
DSS  
Gate-source voltage  
GSS  
JEDEC  
JEITA  
DC  
I
200  
800  
200  
D
Drain current  
mA  
Pulse  
I
DP  
SC-59  
Drain power dissipation (Ta = 25°C)  
Channel temperature  
P
mW  
°C  
D
ch  
stg  
TOSHIBA  
2-3F1F  
T
150  
Weight: 0.012 g (typ.)  
Storage temperature range  
T
55~150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note: This transistor is the electrostatic sensitive device. Please handle with caution.  
Marking  
1
2007-11-01  

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