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UPA2706TP-AZ PDF预览

UPA2706TP-AZ

更新时间: 2024-10-30 21:21:31
品牌 Logo 应用领域
日电电子 - NEC /
页数 文件大小 规格书
7页 148K
描述
Power Field-Effect Transistor, 12A I(D), 30V, 0.029ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, POWER, HSOP-8

UPA2706TP-AZ 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:POWER, HSOP-8Reach Compliance Code:compliant
风险等级:5.72雪崩能效等级(Eas):12.1 mJ
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:30 V
最大漏极电流 (ID):12 A最大漏源导通电阻:0.029 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PDSO-G8
JESD-609代码:e3/e6元件数量:1
端子数量:8工作模式:ENHANCEMENT MODE
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE峰值回流温度(摄氏度):260
极性/信道类型:N-CHANNEL最大脉冲漏极电流 (IDM):48 A
认证状态:Not Qualified表面贴装:YES
端子面层:MATTE TIN/TIN BISMUTH端子形式:GULL WING
端子位置:DUAL处于峰值回流温度下的最长时间:10
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

UPA2706TP-AZ 数据手册

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DATA SHEET  
MOS FIELD EFFECT TRANSISTOR  
µ PA2706TP  
SWITCHING  
N-CHANNEL POWER MOS FET  
DESCRIPTION  
ORDERING INFORMATION  
PART NUMBER  
The µ PA2706TP, which has a heat spreader, is N-channel  
MOS Field Effect Transistor designed for DC/DC converter  
and power management application of notebook computer.  
PACKAGE  
µ PA2706TP  
Power HSOP8  
FEATURES  
Low on-state resistance  
RDS(on)1 = 15 mMAX. (VGS = 10 V, ID = 5.5 A)  
RDS(on)2 = 22.5 mMAX. (VGS = 4.5 V, ID = 5.5 A)  
Low Ciss: Ciss = 660 pF TYP. (VDS = 10 V, VGS = 0 V)  
Small and surface mount package (Power HSOP8)  
ABSOLUTE MAXIMUM RATINGS (TA = 25°C, Unless otherwise noted, all terminals are connected.)  
Drain to Source Voltage (VGS = 0 V)  
Gate to Source Voltage (VDS = 0 V)  
Drain Current (DC) (TC = 25°C)  
Drain Current (DC) Note1  
VDSS  
VGSS  
ID(DC)1  
ID(DC)2  
ID(pulse)  
PT1  
30  
±20  
±20  
±11  
±44  
15  
3
150  
V
V
A
A
Drain Current (pulse) Note2  
A
Total Power Dissipation (TC = 25°C)  
Total Power Dissipation Note1  
Channel Temperature  
W
W
°C  
°C  
A
PT2  
Tch  
Tstg  
IAS  
Storage Temperature  
55 to +150  
11  
Single Avalanche Current Note3  
Single Avalanche Energy Note3  
EAS  
12.1  
mJ  
Notes 1. Mounted on glass epoxy board of 1 inch x 1 inch x 0.8 mm, PW = 10 sec  
2. PW 10 µs, Duty Cycle 1%  
3. Starting Tch = 25°C, VDD = 15 V, RG = 25 , L = 100 µH, VGS = 20 0 V  
Caution Strong electric field, when exposed to this device, can cause destruction of the gate oxide and  
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity  
as much as possible, and quickly dissipate it once, when it has occurred.  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all products and/or types are available in every country. Please check with an NEC Electronics  
sales representative for availability and additional information.  
Document No. G16621EJ1V0DS00 (1st edition)  
Date Published January 2004 NS CP(K)  
Printed in Japan  
2003  

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