TPCP8303
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOSV)
TPCP8303
Unit: mm
Lithium Ion Battery Applications
0.33±0.05
Notebook PC Applications
A
M
0.05
5
8
Portable Equipment Applications
•
•
•
•
Low drain-source ON-resistance: R
High forward transfer admittance: |Y | = 12 S (typ.)
= 41 mΩ (typ.)
DS(ON)
fs
0.475
1
4
Low leakage current: I
= −10 μA (max) (V = −20 V)
DS
DSS
B
B
M
0.05
0.65
Enhancement mode: V = −0.3 to −1.0 V (V = −10 V, I = −1 mA)
th
DS
D
2.9±0.1
A
0.8±0.05
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 Common)
S
0.025
+0.1
S
0.28
0.17±0.02
-0.11
Characteristic
Drain-source voltage
Symbol
Rating
Unit
+0.13
-0.12
1.12
1.12
V
−20
−20
V
V
V
DSS
+0.13
-0.12
Drain-gate voltage (R
Gate-source voltage
= 20 kΩ)
V
GS
DGR
+0.1
V
±8
GSS
0.28
-0.11
1. Source1
2. Gate1
5. Drain2
6. Drain2
7. Drain1
8. Drain1
DC
Pulse
(Note 1)
(Note 1)
I
−3.8
−15.2
D
Drain current
A
I
DP
3. Source2
4. Gate2
Single-device operation
(Note 3a)
P
P
P
P
1.48
1.23
0.58
0.36
D (1)
Drain power
dissipation
(t = 5 s) (Note 2a)
Single-device value at
dual operation (Note 3b)
JEDEC
JEITA
⎯
⎯
D (2)
D (1)
D (2)
W
Single-device operation
(Note 3a)
Drain power
dissipation
(t = 5 s) (Note 2b)
TOSHIBA
2-3V1G
Single-device value at
dual operation (Note 3b)
Weight: 0.017 g (typ.)
Single-pulse avalanche energy
Avalanche current
(Note 4)
E
18.8
mJ
A
AS
I
−3.8
AR
Repetitive avalanche energy
Single-device value at dual operation
E
0.04
mJ
AR
(Note 2a, 3b, 5)
Channel temperature
T
150
°C
°C
ch
Storage temperature range
T
stg
−55 to 150
Note: For Notes 1 to 6, see the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and
Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with care.
Circuit Configuration
Marking (Note 6)
8
7
6
5
8
7
5
6
8303
2
1
4
3
1
2
3
4
Lot No.
1
2010-01-14