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SN74BCT8374A

更新时间： 2024-11-03 22:53:35
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德州仪器 - TI 触发器测试
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26页 470K
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SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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SN74BCT8374A 数据手册

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SN54BCT8374A, SN74BCT8374A  
SCAN TEST DEVICES  
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS  
SCBS045E – JUNE 1990 – REVISED JULY 1996  
SN54BCT8374A . . . JT PACKAGE  
SN74BCT8374A . . . DW OR NT PACKAGE  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
(TOP VIEW)  
Octal Test-Integrated Circuits  
CLK  
1Q  
2Q  
3Q  
4Q  
GND  
5Q  
6Q  
OE  
1D  
2D  
3D  
4D  
5D  
V
1
2
3
4
5
6
7
8
9
24  
23  
22  
21  
20  
19  
18  
17  
16  
Functionally Equivalent to ’F374 and  
’BCT374 in the Normal-Function Mode  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
Test Operation Synchronous to Test  
Access Port (TAP)  
CC  
6D  
7D  
Implement Optional Test Reset Signal by  
Recognizing a Double-High-Level Voltage  
(10 V) on TMS Pin  
7Q  
8Q 10  
15 8D  
TDO  
TMS  
TDI  
TCK  
11  
12  
14  
13  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP,  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
SN54BCT8374A . . . FK PACKAGE  
(TOP VIEW)  
– Sample Inputs/Toggle Outputs  
4
3
2
1
28 27 26  
25  
5
6
7
8
9
2D  
1D  
OE  
NC  
CLK  
1Q  
8D  
TDI  
TCK  
Package Options Include Plastic  
24  
23  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Plastic  
(NT) and Ceramic (JT) 300-mil DIPs  
22 NC  
21 TMS  
20 TDO  
19 8Q  
10  
11  
description  
2Q  
12 13 14 15 16 17 18  
The ’BCT8374A scan test devices with octal  
edge-triggered D-type flip-flops are members of  
the Texas Instruments SCOPE  
testability  
integrated-circuit family. This family of devices  
supports IEEE Standard 1149.1-1990 boundary  
scan to facilitate testing of complex circuit-board  
assemblies. Scan access to the test circuitry is  
accomplished via the 4-wire test access port  
(TAP) interface.  
NC – No internal connection  
In the normal mode, these devices are functionally equivalent to the ’F374 and ’BCT374 octal D-type flip-flops.  
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device  
terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect  
the functional operation of the SCOPE octal flip-flops.  
In the test mode, the normal operation of the SCOPE octal flip-flops is inhibited and the test circuitry is enabled  
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform  
boundary-scan test operations as described in IEEE Standard 1149.1-1990.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE is a trademark of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...26

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SN74BCT8374A 替代型号

型号 品牌 替代类型 描述 数据表
SN54BCT8374A TI

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