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SN74BCT8374ANTE4

更新时间： 2024-09-28 22:47:51
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器触发器逻辑集成电路测试光电二极管信息通信管理
页数 文件大小 规格书
26页 470K
描述
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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中文翻译

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SN74BCT8374ANTE4 技术参数

是否Rohs认证：符合生命周期：Obsolete
零件包装代码：DIP包装说明：PLASTIC, DIP-24
针数：24Reach Compliance Code：unknown
风险等级：5.38Is Samacsys：N
其他特性：SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN系列：BCT/FBT
JESD-30 代码：R-PDIP-T24长度：31.64 mm
逻辑集成电路类型：BOUNDARY SCAN BUS DRIVER最大频率@ Nom-Sup：70000000 Hz
最大I（ol）：0.064 A位数：8
功能数量：1端口数量：2
端子数量：24最高工作温度：70 °C
最低工作温度：输出特性：3-STATE
输出极性：TRUE封装主体材料：PLASTIC/EPOXY
封装代码：DIP封装等效代码：DIP24,.3
封装形状：RECTANGULAR封装形式：IN-LINE
峰值回流温度（摄氏度）：NOT SPECIFIED电源：5 V
最大电源电流（ICC）：52 mAProp。Delay @ Nom-Sup：10 ns
传播延迟（tpd）：9.5 ns认证状态：Not Qualified
座面最大高度：5.08 mm子类别：FF/Latches
最大供电电压 (Vsup)：5.5 V最小供电电压 (Vsup)：4.5 V
标称供电电压 (Vsup)：5 V表面贴装：NO
技术：BICMOS温度等级：COMMERCIAL
端子形式：THROUGH-HOLE端子节距：2.54 mm
端子位置：DUAL处于峰值回流温度下的最长时间：NOT SPECIFIED
触发器类型：POSITIVE EDGE宽度：7.62 mm
Base Number Matches：1

SN74BCT8374ANTE4 数据手册

 浏览型号SN74BCT8374ANTE4的Datasheet PDF文件第2页浏览型号SN74BCT8374ANTE4的Datasheet PDF文件第3页浏览型号SN74BCT8374ANTE4的Datasheet PDF文件第4页浏览型号SN74BCT8374ANTE4的Datasheet PDF文件第5页浏览型号SN74BCT8374ANTE4的Datasheet PDF文件第6页浏览型号SN74BCT8374ANTE4的Datasheet PDF文件第7页 
SN54BCT8374A, SN74BCT8374A  
SCAN TEST DEVICES  
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS  
SCBS045E – JUNE 1990 – REVISED JULY 1996  
SN54BCT8374A . . . JT PACKAGE  
SN74BCT8374A . . . DW OR NT PACKAGE  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
(TOP VIEW)  
Octal Test-Integrated Circuits  
CLK  
1Q  
2Q  
3Q  
4Q  
GND  
5Q  
6Q  
OE  
1D  
2D  
3D  
4D  
5D  
V
1
2
3
4
5
6
7
8
9
24  
23  
22  
21  
20  
19  
18  
17  
16  
Functionally Equivalent to ’F374 and  
’BCT374 in the Normal-Function Mode  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
Test Operation Synchronous to Test  
Access Port (TAP)  
CC  
6D  
7D  
Implement Optional Test Reset Signal by  
Recognizing a Double-High-Level Voltage  
(10 V) on TMS Pin  
7Q  
8Q 10  
15 8D  
TDO  
TMS  
TDI  
TCK  
11  
12  
14  
13  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP,  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
SN54BCT8374A . . . FK PACKAGE  
(TOP VIEW)  
– Sample Inputs/Toggle Outputs  
4
3
2
1
28 27 26  
25  
5
6
7
8
9
2D  
1D  
OE  
NC  
CLK  
1Q  
8D  
TDI  
TCK  
Package Options Include Plastic  
24  
23  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Plastic  
(NT) and Ceramic (JT) 300-mil DIPs  
22 NC  
21 TMS  
20 TDO  
19 8Q  
10  
11  
description  
2Q  
12 13 14 15 16 17 18  
The ’BCT8374A scan test devices with octal  
edge-triggered D-type flip-flops are members of  
the Texas Instruments SCOPE  
testability  
integrated-circuit family. This family of devices  
supports IEEE Standard 1149.1-1990 boundary  
scan to facilitate testing of complex circuit-board  
assemblies. Scan access to the test circuitry is  
accomplished via the 4-wire test access port  
(TAP) interface.  
NC – No internal connection  
In the normal mode, these devices are functionally equivalent to the ’F374 and ’BCT374 octal D-type flip-flops.  
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device  
terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect  
the functional operation of the SCOPE octal flip-flops.  
In the test mode, the normal operation of the SCOPE octal flip-flops is inhibited and the test circuitry is enabled  
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform  
boundary-scan test operations as described in IEEE Standard 1149.1-1990.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE is a trademark of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...26

中文翻译

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SN74BCT8374ANTE4 替代型号

型号 品牌 替代类型 描述 数据表
SN74BCT8374ADWRE4 TI

完全替代

 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374ADWR TI

完全替代

 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374ANT TI

完全替代

 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

与SN74BCT8374ANTE4相关器件

型号 品牌 获取价格 描述 数据表
SN74BCT8374DW ROCHESTER

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 		Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24, DSO-
SN74BCT8374DWR TI

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 		暂无描述
SN74BCT8374DWR ROCHESTER

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 		Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24, DSO-
SN74BCT8374NT ROCHESTER

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 		Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDIP24, DIP-
SN74BCT899 TI

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 		9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/CHECKER
SN74BCT899DW TI

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 		9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70
SN74BCT899DW ROCHESTER

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 		BCT/FBT SERIES, 9-BIT REGISTERED TRANSCEIVER, TRUE OUTPUT, PDSO28, PLASTIC, SOIC-28
SN74BCT899DWR TI

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 		9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/CHECKER
SN74BCT899NT TI

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 		IC,BUS TRANSCEIVER,SINGLE,8-BIT,BICMOS-TTL,DIP,28PIN,PLASTIC
SN74BCT956 TI

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 		OCTAL BUS TRANSCEIVER AND LATCH WITH 3-STATE OUTPUTS

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