SN74BCT8374ANT

更新时间： 2024-11-03 22:37:03

品牌	Logo	应用领域
德州仪器 - TI		总线驱动器总线收发器触发器逻辑集成电路测试光电二极管信息通信管理
页数	文件大小	规格书
26页	470K
描述
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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SN74BCT8374ANT 技术参数

是否Rohs认证：	符合	生命周期：	Obsolete
零件包装代码：	DIP	包装说明：	DIP, DIP24,.3
针数：	24	Reach Compliance Code：	unknown
HTS代码：	8542.39.00.01	Factory Lead Time：	1 week
风险等级：	5.33	其他特性：	SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
系列：	BCT/FBT	JESD-30 代码：	R-PDIP-T24
长度：	31.64 mm	逻辑集成电路类型：	BOUNDARY SCAN BUS DRIVER
最大频率@ Nom-Sup：	70000000 Hz	最大I（ol）：	0.064 A
位数：	8	功能数量：	1
端口数量：	2	端子数量：	24
最高工作温度：	70 °C	最低工作温度：
输出特性：	3-STATE	输出极性：	TRUE
封装主体材料：	PLASTIC/EPOXY	封装代码：	DIP
封装等效代码：	DIP24,.3	封装形状：	RECTANGULAR
封装形式：	IN-LINE	峰值回流温度（摄氏度）：	NOT SPECIFIED
电源：	5 V	最大电源电流（ICC）：	52 mA
Prop。Delay @ Nom-Sup：	10 ns	传播延迟（tpd）：	9.5 ns
认证状态：	Not Qualified	座面最大高度：	5.08 mm
子类别：	FF/Latches	最大供电电压 (Vsup)：	5.5 V
最小供电电压 (Vsup)：	4.5 V	标称供电电压 (Vsup)：	5 V
表面贴装：	NO	技术：	BICMOS
温度等级：	COMMERCIAL	端子形式：	THROUGH-HOLE
端子节距：	2.54 mm	端子位置：	DUAL
处于峰值回流温度下的最长时间：	NOT SPECIFIED	触发器类型：	POSITIVE EDGE
宽度：	7.62 mm	Base Number Matches：	1

SN74BCT8374ANT 数据手册

SN54BCT8374A, SN74BCT8374A

SCAN TEST DEVICES

WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

SCBS045E – JUNE 1990 – REVISED JULY 1996

SN54BCT8374A . . . JT PACKAGE

SN74BCT8374A . . . DW OR NT PACKAGE

Members of the Texas Instruments

SCOPE Family of Testability Products

(TOP VIEW)

Octal Test-Integrated Circuits

CLK

GND

Functionally Equivalent to ’F374 and

’BCT374 in the Normal-Function Mode

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Test Operation Synchronous to Test

Access Port (TAP)

Implement Optional Test Reset Signal by

Recognizing a Double-High-Level Voltage

(10 V) on TMS Pin

8Q 10

15 8D

TDO

TMS

TDI

TCK

SCOPE Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

SN54BCT8374A . . . FK PACKAGE

(TOP VIEW)

– Sample Inputs/Toggle Outputs

28 27 26

CLK

TDI

TCK

Package Options Include Plastic

Small-Outline (DW) Packages, Ceramic

Chip Carriers (FK), and Standard Plastic

(NT) and Ceramic (JT) 300-mil DIPs

22 NC

21 TMS

20 TDO

19 8Q

description

12 13 14 15 16 17 18

The ’BCT8374A scan test devices with octal

edge-triggered D-type flip-flops are members of

the Texas Instruments SCOPE

testability

integrated-circuit family. This family of devices

supports IEEE Standard 1149.1-1990 boundary

scan to facilitate testing of complex circuit-board

assemblies. Scan access to the test circuitry is

accomplished via the 4-wire test access port

(TAP) interface.

NC – No internal connection

In the normal mode, these devices are functionally equivalent to the ’F374 and ’BCT374 octal D-type flip-flops.

The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device

terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect

the functional operation of the SCOPE octal flip-flops.

In the test mode, the normal operation of the SCOPE octal flip-flops is inhibited and the test circuitry is enabled

to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform

boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE is a trademark of Texas Instruments Incorporated.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...26

中文翻译

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SN74BCT8374ANT 替代型号

型号	品牌	替代类型	描述	数据表
SN74BCT8374ADWRE4	TI	完全替代	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374ADWR	TI	完全替代	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

与SN74BCT8374ANT相关器件

型号	品牌	获取价格	描述	数据表
SN74BCT8374ANTE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374DW	ROCHESTER	获取价格	Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24, DSO-
SN74BCT8374DWR	TI	获取价格	暂无描述
SN74BCT8374DWR	ROCHESTER	获取价格	Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24, DSO-
SN74BCT8374NT	ROCHESTER	获取价格	Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDIP24, DIP-
SN74BCT899	TI	获取价格	9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/CHECKER
SN74BCT899DW	TI	获取价格	9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70
SN74BCT899DW	ROCHESTER	获取价格	BCT/FBT SERIES, 9-BIT REGISTERED TRANSCEIVER, TRUE OUTPUT, PDSO28, PLASTIC, SOIC-28
SN74BCT899DWR	TI	获取价格	9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/CHECKER
SN74BCT899NT	TI	获取价格	IC,BUS TRANSCEIVER,SINGLE,8-BIT,BICMOS-TTL,DIP,28PIN,PLASTIC

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