Datasheet > SN74BCT8245ADWG4

SN74BCT8245ADWG4

更新时间： 2024-11-04 05:17:35

品牌	Logo	应用领域
德州仪器 - TI		总线收发器测试
页数	文件大小	规格书
29页	659K
描述
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

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SN74BCT8245ADWG4 数据手册

SN54BCT8245A, SN74BCT8245A

SCAN TEST DEVICES

WITH OCTAL BUS TRANSCEIVERS

SCBS043E – MAY 1990 – REVISED JULY 1996

SN54BCT8245A . . . JT PACKAGE

SN74BCT8245A . . . DW OR NT PACKAGE

(TOP VIEW)

Members of the Texas Instruments

SCOPE Family of Testability Products

Octal Test-Integrated Circuits

Functionally Equivalent to ’F245 and

’BCT245 in the Normal- Function Mode

DIR

GND

24 OE

23 A1

22 A2

21 A3

20 A4

19 A5

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Test Operation Synchronous to Test

Access Port (TAP)

17 A6

16 A7

Implement Optional Test Reset Signal by

Recognizing a Double-High-Level Voltage

(10 V) on TMS Pin

TDO 11

TMS 12

14 TDI

13 TCK

SCOPE Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

SN54BCT8245A . . . FK PACKAGE

(TOP VIEW)

– Sample Inputs/Toggle Outputs

28 27 26

DIR

TDI

TCK

Package Options Include Plastic

Small-Outline (DW) Packages, Ceramic

Chip Carriers (FK), and Standard Plastic

and Ceramic 300-mil DIPs (JT, NT)

22 NC

21 TMS

20 TDO

19 B8

description

The ’BCT8245A scan test devices with octal bus

transceivers are members of the Texas

12 13 14 15 16 17 18

Instruments SCOPE

testability integrated-

circuit family. This family of devices supports IEEE

Standard 1149.1-1990 boundary scan to facilitate

testing of complex circuit-board assemblies. Scan

access to the test circuitry is accomplished via the

4-wire test access port (TAP) interface.

NC – No internal connection

In the normal mode, these devices are functionally equivalent to the ’F245 and ’BCT245 octal bus transceivers.

The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device

terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect

the functional operation of the SCOPE octal bus transceivers.

In the test mode, the normal operation of the SCOPE octal bus transceivers is inhibited and the test circuitry

is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform

boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE is a trademark of Texas Instruments Incorporated.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...29

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SN74BCT8245ADWG4 替代型号

型号	品牌	替代类型	描述	数据表
SN74BCT8245ANT	TI	完全替代	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245ADWR	TI	完全替代	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245ADW	TI	完全替代	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

与SN74BCT8245ADWG4相关器件

型号	品牌	获取价格	描述	数据表
SN74BCT8245ADWR	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245ADWRE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245ADWRG4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245AFK	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245ANT	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245ANTE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8373	TI	获取价格	SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
SN74BCT8373A	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADW	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADWE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

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