SN74BCT8373

更新时间： 2024-09-29 11:58:31

品牌	Logo	应用领域
德州仪器 - TI		锁存器测试
页数	文件大小	规格书
21页	293K
描述
SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES

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SN74BCT8373 数据手册

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SCBS471 − JUNE 1990 − REVISED JUNE 1994

DW OR NT PACKAGE

(TOP VIEW)

• Member of the Texas Instruments SCOPE 

Family of Testability Products

• Octal Test-Integrated Circuit

GND

• Functionally Equivalent to SN74F373 and

SN74BCT373 in the Normal-Function Mode

• Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

• Test Operation Synchronous to Test

Access Port (TAP)

• Implements Optional Test Reset Signal by

Recognizing a Double-High-Level Voltage

(10 V) on TMS Pin

8Q 10

15 8D

TDO

TMS

TDI

TCK

• SCOPE  Instruction Set

− IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP

and HIGHZ

− Parallel-Signature Analysis at Inputs

− Pseudo-Random Pattern Generation

From Outputs

− Sample Inputs/Toggle Outputs

• Package Options Include Plastic

Small-Outline (DW) Packages and

Standard Plastic 300-mil DIPs (NT)

description

The SN74BCT8373 scan test device with octal D-type latches is a member of the Texas Instruments SCOPE

testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan

to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via

the 4-wire test access port (TAP) interface.

In the normal mode, this device is functionally equivalent to the SN74F373 and SN74BCT373 octal D-type

latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the

device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does

not affect the functional operation of the SCOPE octal latches.

In the test mode, the normal operation of the SCOPE octal latches is inhibited and the test circuitry is enabled

to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform

boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output

(TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing

functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation

(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN74BCT8373 is characterized for operation from 0°C to 70°C.

SCOPE is a trademark of Texas Instruments Incorporated.

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2−1

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443

12 3 4 5 6 7...21

中文翻译

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与SN74BCT8373相关器件

型号	品牌	获取价格	描述	数据表
SN74BCT8373A	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADW	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADWE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADWG4	TI	获取价格	BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24
SN74BCT8373ADWR	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ADWRE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ANT	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373ANTE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SN74BCT8373DW	TI	获取价格	SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
SN74BCT8373DWR	TI	获取价格	Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70

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