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SCES592A − JULY 2004 − REVISED SEPTEMBER 2005
D
D
D
Available in the Texas Instruments
NanoStar and NanoFree Packages
Low Static-Power Consumption;
D
D
D
D
D
D
Wide Operating V
Range of 0.8 V to 3.6 V
CC
Optimized for 3.3-V Operation
3.6-V I/O Tolerant to Support Mixed-Mode
Signal Operation
I
= 0.9 µA Max
CC
Low Dynamic-Power Consumption;
= 3 pF Typ at 3.3 V
t
= 3.6 ns Max at 3.3 V
pd
C
pd
Suitable for Point-to-Point Applications
D
Low Input Capacitance; C = 1.5 pF Typ
i
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
D
Low Noise − Overshoot and Undershoot
<10% of V
CC
D
ESD Performance Tested Per JESD 22
− 2000-V Human-Body Model
(A114-B, Class II)
− 200-V Machine Model (A115-A)
− 1000-V Charged-Device Model (C101)
D
D
I
Supports Partial-Power-Down Mode
off
Operation
Input Hysteresis Allows Slow Input
Transition and Better Switching Noise
Immunity at the Input
D
ESD Protection Exceeds 5000 V With
Human-Body Model
(V
= 250 mV Typ at 3.3 V)
hys
DBV OR DCK PACKAGE
(TOP VIEW)
YEP OR YZP PACKAGE
(BOTTOM VIEW)
3 4
2
GND
CLK
D
Q
V
1
2
3
5
4
D
CLK
GND
V
CC
1 5
Q
CC
description/ordering information
The AUP family is TI’s premier solution to the industry’s low power needs in battery-powered portable
applications. This family ensures a very low static and dynamic power consumption across the entire V range
CC
of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity (see
Figures 1 and 2).
Static-Power Consumption
Dynamic-Power Consumption
(pF)
Switching Characteristics
†
(µA)
at 25 MHz
3.5
3
100%
100%
80%
60%
80%
2.5
2
Input
Output
60%
40%
3.3-V
3.3-V
LVC †
Logic
1.5
1
†
Logic
40%
0.5
0
20%
0%
20%
0%
AUP
AUP
AUP
−0.5
10
15 20
Time − ns
0
5
25
35 40 45
30
†
Single, dual, and triple gates
†
AUP1G08 data at C = 15 pF
L
Figure 2. Excellent Signal Integrity
Figure 1. AUP − The Lowest-Power Family
This is a single positive-edge-triggered D-type flip-flop. When data at the data (D) input meets the setup time
requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock
triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the
hold-time interval, data at the D input can be changed without affecting the levels at the outputs.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar and NanoFree are trademarks of Texas Instruments.
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Copyright 2005, Texas Instruments Incorporated
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