Datasheet > SN74ABT18502_06

SN74ABT18502_06

更新时间： 2024-11-11 05:25:03

品牌	Logo	应用领域
德州仪器 - TI		总线收发器测试
页数	文件大小	规格书
30页	433K
描述
SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

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SN74ABT18502_06 数据手册

SN74ABT18502

SCAN TEST DEVICE

WITH 18-BIT REGISTERED BUS TRANSCEIVER

SCBS753 – FEBRUARY 2002

Member of the Texas Instruments

Widebus Family

SCOPE Instruction Set

– IEEE Std 1149.1-1990 Required

Instructions, Optional INTEST, and

P1149.1A CLAMP and HIGHZ

– Parallel Signature Analysis (PSA) at

Inputs With Masking Option

– Pseudorandom Pattern Generation

(PRPG) From Outputs

– Sample Inputs/Toggle Outputs (TOPSIP)

– Binary Count From Outputs

– Device Identification

UBT Transceiver Combines D-Type

Latches and D-Type Flip-Flops for

Operation in Transparent, Latched, or

Clocked Mode

Compatible With IEEE Std 1149.1-1990

(JTAG) Test Access Port (TAP) and

Boundary-Scan Architecture

Includes D-Type Flip-Flops and Control

Circuitry to Provide Multiplexed

Transmission of Stored and Real-Time Data

– Even-Parity Opcodes

Two Boundary-Scan Cells (BSCs) Per I/O

for Greater Flexibility

PM PACKAGE

(TOP VIEW)

64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49

1A3

1A4

1A5

GND

1A6

1A7

1A8

1A9

1B4

1B5

1B6

GND

1B7

1B8

1B9

2B1

2B2

2B3

2B4

GND

2B5

2B6

2B7

2A1

2A2

2A3

GND

2A4

2A5

2A6

17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE, UBT, and Widebus are trademarks of Texas Instruments.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...30

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