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SN74ABT18502PM PDF预览

SN74ABT18502PM

更新时间: 2024-11-11 05:25:03
品牌 Logo 应用领域
德州仪器 - TI 总线收发器测试
页数 文件大小 规格书
30页 433K
描述
SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

SN74ABT18502PM 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:QFP
包装说明:LFQFP, QFP64,.47SQ,20针数:64
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:1 week
风险等级:1.48其他特性:WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION
控制类型:INDEPENDENT CONTROL计数方向:BIDIRECTIONAL
系列:ABTJESD-30 代码:S-PQFP-G64
JESD-609代码:e4长度:10 mm
负载电容(CL):50 pF逻辑集成电路类型:BOUNDARY SCAN REG BUS TRANSCEIVER
最大I(ol):0.064 A湿度敏感等级:3
位数:9功能数量:2
端口数量:2端子数量:64
最高工作温度:85 °C最低工作温度:-40 °C
输出特性:3-STATE输出极性:TRUE
封装主体材料:PLASTIC/EPOXY封装代码:LFQFP
封装等效代码:QFP64,.47SQ,20封装形状:SQUARE
封装形式:FLATPACK, LOW PROFILE, FINE PITCH包装方法:TRAY
峰值回流温度(摄氏度):260电源:5 V
最大电源电流(ICC):80 mAProp。Delay @ Nom-Sup:6 ns
传播延迟(tpd):6 ns认证状态:Not Qualified
座面最大高度:1.6 mm子类别:Bus Driver/Transceiver
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:BICMOS温度等级:INDUSTRIAL
端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)端子形式:GULL WING
端子节距:0.5 mm端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED翻译:N/A
触发器类型:POSITIVE EDGE宽度:10 mm

SN74ABT18502PM 数据手册

 浏览型号SN74ABT18502PM的Datasheet PDF文件第2页浏览型号SN74ABT18502PM的Datasheet PDF文件第3页浏览型号SN74ABT18502PM的Datasheet PDF文件第4页浏览型号SN74ABT18502PM的Datasheet PDF文件第5页浏览型号SN74ABT18502PM的Datasheet PDF文件第6页浏览型号SN74ABT18502PM的Datasheet PDF文件第7页 
SN74ABT18502  
SCAN TEST DEVICE  
WITH 18-BIT REGISTERED BUS TRANSCEIVER  
SCBS753 – FEBRUARY 2002  
Member of the Texas Instruments  
Widebus Family  
SCOPE Instruction Set  
– IEEE Std 1149.1-1990 Required  
Instructions, Optional INTEST, and  
P1149.1A CLAMP and HIGHZ  
– Parallel Signature Analysis (PSA) at  
Inputs With Masking Option  
– Pseudorandom Pattern Generation  
(PRPG) From Outputs  
– Sample Inputs/Toggle Outputs (TOPSIP)  
– Binary Count From Outputs  
– Device Identification  
UBT Transceiver Combines D-Type  
Latches and D-Type Flip-Flops for  
Operation in Transparent, Latched, or  
Clocked Mode  
Compatible With IEEE Std 1149.1-1990  
(JTAG) Test Access Port (TAP) and  
Boundary-Scan Architecture  
Includes D-Type Flip-Flops and Control  
Circuitry to Provide Multiplexed  
Transmission of Stored and Real-Time Data  
– Even-Parity Opcodes  
Two Boundary-Scan Cells (BSCs) Per I/O  
for Greater Flexibility  
PM PACKAGE  
(TOP VIEW)  
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49  
1A3  
1A4  
1A5  
GND  
1A6  
1A7  
1A8  
1A9  
1B4  
1B5  
1B6  
GND  
1B7  
1B8  
1B9  
1
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
2
3
4
5
6
7
8
V
CC  
9
V
2B1  
2B2  
2B3  
2B4  
GND  
2B5  
2B6  
2B7  
CC  
10  
11  
12  
13  
14  
15  
16  
2A1  
2A2  
2A3  
GND  
2A4  
2A5  
2A6  
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE, UBT, and Widebus are trademarks of Texas Instruments.  
Copyright 2002, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

SN74ABT18502PM 替代型号

型号 品牌 替代类型 描述 数据表
SN74ABT18502PMRG4 TI

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完全替代

SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SN74ABT18502PMG4 TI

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