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SN54HC00TDF2 PDF预览

SN54HC00TDF2

更新时间: 2024-09-14 11:13:43
品牌 Logo 应用领域
德州仪器 - TI 逻辑集成电路
页数 文件大小 规格书
6页 327K
描述
4 通道、2 输入、2V 至 6V 与非门 | TD | 0 | 25 to 25

SN54HC00TDF2 技术参数

生命周期:Active包装说明:DIE,
Reach Compliance Code:not_compliantFactory Lead Time:8 weeks
风险等级:5.75系列:HC/UH
JESD-30 代码:R-XUUC-N14长度:1.2553 mm
逻辑集成电路类型:NAND GATE功能数量:4
输入次数:2端子数量:14
封装主体材料:UNSPECIFIED封装代码:DIE
封装形状:RECTANGULAR封装形式:UNCASED CHIP
包装方法:TUBE峰值回流温度(摄氏度):NOT SPECIFIED
最大供电电压 (Vsup):6 V最小供电电压 (Vsup):2 V
表面贴装:YES技术:CMOS
端子形式:NO LEAD端子位置:UPPER
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:1.0903 mm
Base Number Matches:1

SN54HC00TDF2 数据手册

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Sample &  
Buy  
Support &  
Community  
Product  
Folder  
Tools &  
Software  
Technical  
Documents  
SN54HC00-DIE  
ZHCSC36 FEBRUARY 2014  
SN54HC00-DIE 四路 2 输入正与非门  
1
1 特性  
宽工作电压范围  
低功耗  
低输入电流  
2 说明  
SN54AC00-DIE 器件包含 4 个独立的 2 输入与非门。 每个门在正逻辑中执行布尔函数:Y = A • B Y = A +  
B。  
Ordering Information(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
SN54HC00TDF1  
SN54HC00TDF2  
400  
10  
SN54HC00  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: SCLS747  

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航天类 4 通道、2 输入、2V 至 6V 或非门