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SN54HC04VTDE1 PDF预览

SN54HC04VTDE1

更新时间: 2024-10-31 12:28:11
品牌 Logo 应用领域
德州仪器 - TI 栅极逻辑集成电路
页数 文件大小 规格书
5页 124K
描述
HEX INVERTER Wide Operating Voltage Range

SN54HC04VTDE1 技术参数

生命周期:Active包装说明:DIE-14
Reach Compliance Code:not_compliantFactory Lead Time:8 weeks
风险等级:5.76Is Samacsys:N
系列:HC/UHJESD-30 代码:R-XUUC-N14
长度:1.016 mm逻辑集成电路类型:INVERTER
功能数量:6输入次数:1
端子数量:14封装主体材料:UNSPECIFIED
封装代码:DIE封装形状:RECTANGULAR
封装形式:UNCASED CHIP包装方法:TUBE
峰值回流温度(摄氏度):NOT SPECIFIED表面贴装:YES
技术:CMOS端子形式:NO LEAD
端子位置:UPPER处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:0.889 mmBase Number Matches:1

SN54HC04VTDE1 数据手册

 浏览型号SN54HC04VTDE1的Datasheet PDF文件第2页浏览型号SN54HC04VTDE1的Datasheet PDF文件第3页浏览型号SN54HC04VTDE1的Datasheet PDF文件第4页浏览型号SN54HC04VTDE1的Datasheet PDF文件第5页 
SN54HC04-DIE  
www.ti.com  
SCLS736 JULY 2013  
HEX INVERTER  
Check for Samples: SN54HC04-DIE  
1
FEATURES  
Wide Operating Voltage Range  
Low Input Current  
Low Power Consumption  
DESCRIPTION  
The SN54HC04-DIE contains six independent inverters and performs the Boolean function Y = A in positive  
logic.  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
SN54HC04VTDE1  
SN54HC04VTDE2  
100  
10  
SN54HC04  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control  
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature  
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual  
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2013, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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