SN54HC04, SN74HC04
HEX INVERTERS
SCLS078D – DECEMBER 1982 – REVISED JULY 2003
Wide Operating Voltage Range of 2 V to 6 V
Outputs Can Drive Up To 10 LSTTL Loads
Typical t = 8 ns
pd
±4-mA Output Drive at 5 V
Low Power Consumption, 20-µA Max I
Low Input Current of 1 µA Max
CC
SN54HC04 . . . J OR W PACKAGE
SN74HC04 . . . D, N, NS, OR PW PACKAGE
(TOP VIEW)
SN54HC04 . . . FK PACKAGE
(TOP VIEW)
1A
1Y
V
CC
1
2
3
4
5
6
7
14
13
12
11
3
2
1
20 19
18
6A
6Y
5A
6Y
NC
5A
2A
NC
2Y
4
5
6
7
8
2A
17
16
2Y
3A
10 5Y
15 NC
14
9 10 11 12 13
NC
3A
9
8
3Y
4A
4Y
5Y
GND
NC – No internal connection
description/ordering information
The ’HC04 devices contain six independent inverters. They perform the Boolean function
Y = A in positive logic.
ORDERING INFORMATION
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
†
PACKAGE
T
A
PDIP – N
Tube of25
SN74HC04N
SN74HC04N
Tube of 50
Reel of 2500
Reel of 250
Reel of 2000
Tube of 90
Reel of 2000
Reel of 250
Tube of 25
Tube of 150
Tube of 55
SN74HC04D
SOIC – D
SN74HC04DR
SN74HC04DT
SN74HC04NSR
SN74HC04PW
SN74HC04PWR
SN74HC04PWT
SNJ54HC04J
SNJ54HC04W
SNJ54HC04FK
HC04
–40°C to 85°C
SOP – NS
TSSOP – PW
HC04
HC04
CDIP – J
CFP – W
LCCC – FK
SNJ54HC04J
SNJ54HC04W
SNJ54HC04FK
–55°C to 125°C
†
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
FUNCTION TABLE
(each inverter)
INPUT
A
OUTPUT
Y
H
L
L
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2003, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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