NTD2955, NTD2955P,
NVD2955
Power MOSFET
−60 V, −12 A, P−Channel DPAK
This Power MOSFET is designed to withstand high energy in the
avalanche and commutation modes. Designed for low−voltage, high−
speed switching applications in power supplies, converters, and power
motor controls. These devices are particularly well suited for bridge
circuits where diode speed and commutating safe operating areas are
critical and offer an additional safety margin against unexpected
voltage transients.
http://onsemi.com
V
R
TYP
I MAX
D
(BR)DSS
DS(on)
−60 V
155 mW @ −10 V, 6 A
−12 A
P−Channel
D
Features
• Avalanche Energy Specified
• I
and V
Specified at Elevated Temperature
DSS
DS(on)
• Designed for Low−Voltage, High−Speed Switching Applications and
to Withstand High Energy in the Avalanche and Commutation Modes
• NVD Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q101
Qualified and PPAP Capable
G
S
MARKING DIAGRAMS
• These Devices are Pb−Free and are RoHS Compliant
4
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
4
4
Rating
Symbol
Value
Unit
2
1
Drain
Drain
3
Drain−to−Source Voltage
V
DSS
−60
Vdc
DPAK
CASE 369C
STYLE 2
Gate−to−Source Voltage
− Continuous
V
GSM
20
25
Vdc
Vpk
GS
V
− Non−repetitive (t ≤ 10 ms)
p
Drain Current
Drain Current − Continuous @ T = 25°C
Drain Current − Single Pulse (t ≤ 10 ms)
I
−12
−18
Adc
Apk
2
2
D
a
1
Gate
1
Gate
3
3
I
Drain
Drain
DM
p
Source
Source
Total Power Dissipation @ T = 25°C
P
55
W
a
D
4
Operating and Storage Temperature
Range
T , T
−55 to
175
°C
J
stg
4
Drain
Single Pulse Drain−to−Source Avalanche
E
AS
216
mJ
Energy − Starting T = 25°C
J
(V = 25 Vdc, V = 10 Vdc, Peak
DD
GS
I = 12 Apk, L = 3.0 mH, R = 25 W)
1
L
G
2
3
Thermal Resistance
R
R
2.73
71.4
100
°C/W
°C
− Junction−to−Case
− Junction−to−Ambient (Note 1)
− Junction−to−Ambient (Note 2)
q
JC
JA
JA
DPAK−3
CASE 369D
STYLE 2
q
1
2
3
R
q
Gate Drain Source
Maximum Lead Temperature for Soldering
Purposes, 1/8 in. from case for
10 seconds
T
260
L
Y
= Year
WW = Work Week
= Pb−Free Package
G
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 6 of this data sheet.
1. When surface mounted to an FR4 board using 1 in pad size
2
(Cu area = 1.127 in ).
2. When surface mounted to an FR4 board using the minimum recommended
2
pad size (Cu area = 0.412 in ).
© Semiconductor Components Industries, LLC, 2012
1
Publication Order Number:
October, 2012 − Rev. 12
NTD2955/D