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NTD2955T4G PDF预览

NTD2955T4G

更新时间: 2024-09-28 17:15:55
品牌 Logo 应用领域
友台半导体 - UMW /
页数 文件大小 规格书
6页 504K
描述
种类:P-Channel;漏源导通电阻:-60V;持续漏极电流(Id)(在25°C时):-12A;Vgs(th)(V):±20;漏源导通电阻:170mΩ@-10V

NTD2955T4G 数据手册

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R
UMW  
NTD2955  
-60V P-Channel MOSFET  
General Description  
This Power MOSFET is designed to withstand high energy in the  
avalanche and commutation modes. Designed for low−voltage, high−  
speed switching applications in power supplies, converters, and power  
motor controls, these devices are particularly well suited for bridge  
circuits where diode speed and commutating safe operating areas are  
critical and offer an additional safety margin against unexpected  
voltage transients.  
Features  
VDS (V) = -60V  
D
RDS(on)  
150 mW  
(VGS = -10V)  
=
ID = -12A (VGS = -10V)  
G
Avalanche Energy Specified  
I and V Specified at Elevated Temperature  
DSS  
DS(on)  
S
Designed for Low−Voltage, High−Speed Switching Applications and  
to Withstand High Energy in the Avalanche and Commutation Modes  
MAXIMUM RATINGS  
Rating  
(T  
°
C unless otherwise noted)  
= 25  
J
Symbol  
Value  
Unit  
Drain−to−Source Voltage  
V
DSS  
−60  
Vdc  
Gate−to−Source Voltage  
− Continuous  
V
V
± 20  
± 25  
Vdc  
Vpk  
GS  
GSM  
− Non−repetitive (t 10 ms)  
p
Drain Current  
Drain Current − Continuous @ T = 25°C  
I
−12  
−36  
Adc  
Apk  
a
D
I
Drain Current − Single Pulse (t 10 ms)  
DM  
p
Total Power Dissipation @ T = 25°C  
P
D
55  
W
a
T , T  
55 to  
175  
°C  
J
stg  
Range  
Operating and Storage Temperature  
Single Pulse Drain−to−Source Avalanche  
E
AS  
216  
mJ  
Energy − Starting T = 25°C  
J
(V = 25 Vdc, V = 10 Vdc, Peak  
DD  
GS  
I = 12 Apk, L = 3.0 mH, R = 25 W)  
L
G
Thermal Resistance  
− Junction−to−Case  
− Junction−to−Ambient (Note 1)  
− Junction−to−Ambient (Note 2)  
R
R
R
2.73  
71.4  
100  
°C/W  
°C  
q
JC  
JA  
JA  
q
q
Maximum Lead Temperature for Soldering  
Purposes, 1/8 in. from case for  
10 seconds  
T
260  
L
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are  
individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded,  
device functional operation is not implied, damage may occur and reliability may be affected.  
1. When surface mounted to an FR4 board using 1 in pad size  
2
(Cu area = 1.127 in ).  
2
2. When surface mounted to an FR4 board using the minimum recommended pad size (Cu area = 0.412 in ).  
www.umw-ic.com  
1
UTD Semiconductor Co.,Limited  

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