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MGFC47B3436B PDF预览

MGFC47B3436B

更新时间: 2024-09-17 21:20:15
品牌 Logo 应用领域
三菱 - MITSUBISHI 局域网放大器晶体管
页数 文件大小 规格书
4页 157K
描述
RF Power Field-Effect Transistor, 1-Element, S Band, Gallium Arsenide, N-Channel, Junction FET, HERMETIC SEALED, METAL CERAMIC, GF-60, 3 PIN

MGFC47B3436B 技术参数

生命周期:Obsolete包装说明:FLANGE MOUNT, R-CDFM-F2
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.84
其他特性:HIGH RELIABILITY外壳连接:SOURCE
配置:SINGLE最小漏源击穿电压:12 V
最大漏极电流 (Abs) (ID):12 A最大漏极电流 (ID):1.5 A
FET 技术:JUNCTION最高频带:S BAND
JESD-30 代码:R-CDFM-F2元件数量:1
端子数量:2工作模式:DEPLETION MODE
最高工作温度:175 °C封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装形状:RECTANGULAR封装形式:FLANGE MOUNT
极性/信道类型:N-CHANNEL功耗环境最大值:115 W
认证状态:Not Qualified子类别:Other Transistors
表面贴装:YES端子形式:FLAT
端子位置:DUAL晶体管应用:AMPLIFIER
晶体管元件材料:GALLIUM ARSENIDEBase Number Matches:1

MGFC47B3436B 数据手册

 浏览型号MGFC47B3436B的Datasheet PDF文件第2页浏览型号MGFC47B3436B的Datasheet PDF文件第3页浏览型号MGFC47B3436B的Datasheet PDF文件第4页 
PRELIMINARY  
MITSUBISHI SEMICONDUCTOR <GaAs FET>  
MGFC47B3436B  
Notice: This is not a final specification.  
Some parametric limits are subject to  
change.  
3.4 - 3.6GHz BAND 50W INTERNALLY MATCHED GaAs FET  
DESCRIPTION  
OUTLINE DRAWING  
The MGFC47B3436B is an internally impedance-matched  
GaAs power FET especially designed for use in 3.4 - 3.6  
GHz band amplifiers.The hermetically sealed metal-ceramic  
package guarantees high reliability.  
FEATURES  
Class AB operation  
Internally matched to 50(ohm) system  
High output power  
Po(SAT) = 50W (TYP.) @ f=3.4 - 3.6 GHz  
High power gain  
GP = 10 dB (TYP.) @ f=3.4 - 3.6 GHz  
Distortion  
EVM = 2.0% (TYP.) @ f=3.4 - 3.6GHz, Po=37dBm  
RECOMMENDED BIAS CONDITIONS  
VDS = 12 (V)  
ID = 1.5 (A)  
RG=10(ohm)  
GF-60  
(Ta=25deg.C)  
ABSOLUTE MAXIMUM RATINGS  
< Keep safety first in your circuit designs! >  
Mitsubishi Electric Corporation puts the maximum effort  
into  
Symbol  
VGDO  
VGSO  
MAXID  
PT *1  
Tch  
Parameter  
Gate to drain voltage  
Gate to source voltage  
Maximum drain current  
Total power dissipation  
Channel temperature  
Storage temperature  
Ratings  
-15  
-10  
12  
115  
Unit  
V
V
A
W
making semiconductor products better and more reliable,  
but there is always the possibility that trouble may occur  
with them. Trouble with semiconductors may lead to  
personal  
injury, fire or property damage. Remember to give due  
consideration to safety when making your circuit designs,  
with appropriate measures such as (1)placement of  
substitutive, auxiliary circuits, (2)use of non-flammable  
175  
-55 / +150  
deg.C  
deg.C  
Tstg  
*1 : Tc=25deg.C  
(Ta=25deg.C)  
ELECTRICAL CARACTERISTICS  
Symbol  
Parameter  
Test conditions  
Limits  
Typ.  
-
47  
10.5  
2.0  
Unit  
Min.  
-0.5  
-
Max.  
-3.0  
-
-
3
VGS(off)  
Po(SAT)  
GP  
Gate to source cut-off voltage  
Output power  
VDS = 3V , ID = 100mA  
VDS=12V, ID(RF off)=1.5A, f=3.4-3.6GHz  
V
dBm  
dB  
A
%
Power gain  
9.0  
ID  
Drain current  
Error Vector Magnitude  
Thermal resistance  
VDS=12V, ID(RF off)=1.5A, f=3.4-3.6GHz  
Pout=37dBm  
-
-
-
EVM *2  
Rth(ch-c) *3  
1.5  
0.65  
2.5  
1.2  
deg.C/W  
delta Vf method  
*2 :WiMAX Downlink, 64QAM-3/4, Channel Bandwidth: 6MHz  
*3 : Channel-case  
MITSUBISHI  
ELECTRIC  
( 1 / 4 )  
Spe. 2007  

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