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MCR12DSN-1 PDF预览

MCR12DSN-1

更新时间: 2024-09-15 13:11:23
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安森美 - ONSEMI 栅极
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7页 126K
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MCR12DSN-1 数据手册

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MCR12DSM, MCR12DSN  
Sensitive Gate Silicon  
Controlled Rectifiers  
Reverse Blocking Thyristors  
Designed for high volume, low cost, industrial and consumer  
applications such as motor control; process control; temperature, light  
and speed control; CDI (Capacitive Discharge Ignition); and small  
engines.  
http://onsemi.com  
SCRs  
12 AMPERES RMS  
600 800 VOLTS  
Features  
Small Size  
Passivated Die for Reliability and Uniformity  
Low Level Triggering and Holding Characteristics  
Epoxy Meets UL 94 V0 @ 0.125 in  
G
A
K
ESD Ratings:  
Human Body Model, 3B u 8000 V  
Machine Model, C u 400 V  
These are PbFree Devices  
MARKING  
DIAGRAMS  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
4
DPAK  
CASE 369C  
STYLE 4  
YWW  
R1  
2DSxG  
Rating  
Symbol  
Value  
Unit  
Peak Repetitive OffState Voltage (Note 1)  
V
V
V
2
1
DRM,  
(T = 40 to 110°C, Sine Wave, 50 Hz to  
3
J
RRM  
60 Hz)  
MCR12DSM  
MCR12DSN  
600  
800  
4
OnState RMS Current  
I
12  
7.6  
100  
A
A
A
T(RMS)  
(180° Conduction Angles; T = 75°C)  
C
IPAK  
CASE 369D  
STYLE 4  
YWW  
R1  
2DSxG  
Average OnState Current  
I
T(AV)  
(180° Conduction Angles; T = 75°C)  
C
1
2
Peak Non-Repetitive Surge Current  
I
TSM  
3
(1/2 Cycle, Sine Wave 60 Hz, T = 110°C)  
J
2
2
Circuit Fusing Consideration (t = 8.3 msec)  
Forward Peak Gate Power  
I t  
41  
A sec  
Y
WW  
= Year  
= Work Week  
P
5.0  
W
W
A
GM  
R12DSx = Device Code  
x= M or N  
G
(Pulse Width 10 sec, T = 75°C)  
C
Forward Average Gate Power  
P
0.5  
2.0  
= PbFree Package  
G(AV)  
(t = 8.3 msec, T = 75°C)  
C
Forward Peak Gate Current  
I
GM  
(Pulse Width 10 sec, T = 75°C)  
PIN ASSIGNMENT  
Cathode  
C
1
Operating Junction Temperature Range  
Storage Temperature Range  
T
J
40 to 110  
40 to 150  
°C  
°C  
2
3
4
Anode  
T
stg  
Gate  
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
Recommended Operating Conditions may affect device reliability.  
Anode  
1. V  
and V  
for all types can be applied on a continuous basis. Ratings  
DRM  
RRM  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 5 of this data sheet.  
apply for zero or negative gate voltage; however, positive gate voltage shall  
not be applied concurrent with negative potential on the anode. Blocking  
voltages shall not be tested with a constant current source such that the  
voltage ratings of the device are exceeded.  
© Semiconductor Components Industries, LLC, 2013  
1
Publication Order Number:  
June, 2013 Rev. 7  
MCR12DSM/D  
 

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