MCR12DSM, MCR12DSN
Sensitive Gate Silicon
Controlled Rectifiers
Reverse Blocking Thyristors
Designed for high volume, low cost, industrial and consumer
applications such as motor control; process control; temperature, light
and speed control; CDI (Capacitive Discharge Ignition); and small
engines.
http://onsemi.com
SCRs
12 AMPERES RMS
600 − 800 VOLTS
Features
• Small Size
• Passivated Die for Reliability and Uniformity
• Low Level Triggering and Holding Characteristics
• Epoxy Meets UL 94 V−0 @ 0.125 in
G
A
K
• ESD Ratings:
Human Body Model, 3B u 8000 V
Machine Model, C u 400 V
• These are Pb−Free Devices
MARKING
DIAGRAMS
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
4
DPAK
CASE 369C
STYLE 4
YWW
R1
2DSxG
Rating
Symbol
Value
Unit
Peak Repetitive Off−State Voltage (Note 1)
V
V
V
2
1
DRM,
(T = −40 to 110°C, Sine Wave, 50 Hz to
3
J
RRM
60 Hz)
MCR12DSM
MCR12DSN
600
800
4
On−State RMS Current
I
12
7.6
100
A
A
A
T(RMS)
(180° Conduction Angles; T = 75°C)
C
IPAK
CASE 369D
STYLE 4
YWW
R1
2DSxG
Average On−State Current
I
T(AV)
(180° Conduction Angles; T = 75°C)
C
1
2
Peak Non-Repetitive Surge Current
I
TSM
3
(1/2 Cycle, Sine Wave 60 Hz, T = 110°C)
J
2
2
Circuit Fusing Consideration (t = 8.3 msec)
Forward Peak Gate Power
I t
41
A sec
Y
WW
= Year
= Work Week
P
5.0
W
W
A
GM
R12DSx = Device Code
x= M or N
G
(Pulse Width ≤ 10 ꢀ sec, T = 75°C)
C
Forward Average Gate Power
P
0.5
2.0
= Pb−Free Package
G(AV)
(t = 8.3 msec, T = 75°C)
C
Forward Peak Gate Current
I
GM
(Pulse Width ≤ 10 ꢀ sec, T = 75°C)
PIN ASSIGNMENT
Cathode
C
1
Operating Junction Temperature Range
Storage Temperature Range
T
J
−40 to 110
−40 to 150
°C
°C
2
3
4
Anode
T
stg
Gate
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
Anode
1. V
and V
for all types can be applied on a continuous basis. Ratings
DRM
RRM
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 5 of this data sheet.
apply for zero or negative gate voltage; however, positive gate voltage shall
not be applied concurrent with negative potential on the anode. Blocking
voltages shall not be tested with a constant current source such that the
voltage ratings of the device are exceeded.
© Semiconductor Components Industries, LLC, 2013
1
Publication Order Number:
June, 2013 − Rev. 7
MCR12DSM/D