FSPYE130R, FSPYE130F
Data Sheet
December 2001
Radiation Hardened, SEGR Resistant
N-Channel Power MOSFETs
Features
• 20A (Current Limited by Package), 100V, r
= 0.043Ω
DS(ON)
Fairchild Star*Power Rad Hard
MOSFETs have been specifically
• UIS Rated
TM
• Total Dose
developed for high performance
applications in a commercial or
military space environment. Star*Power MOSFETs offer the
- Meets Pre-rad Specifications to 100 krad (Si)
- Rated to 300 krad (Si)
system designer both extremely low r
and Gate
DS(ON)
• Single Event
Charge allowing the development of low loss Power
Subsystems. Star*Power FETs combine this electrical
capability with total dose radiation hardness up to 300 krads
while maintaining the guaranteed performance for Single
Event Effects (SEE) which the Fairchild FS families have
always featured.
- Safe Operating Area Curve for Single Event Effects
2
- SEE Immunity for LET of 36MeV/mg/cm with
V
up to 100% of Rated Breakdown
of 5V Off-Bias
DS
V
GS
• Dose Rate
- Typically Survives 3E9 rad (Si)/s at 80% BV
DSS
The Fairchild portfolio of Star*Power FETs includes a family
of devices in various voltage, current and package styles.
The Star*Power family consists of Star*Power and
- Typically Survives 2E12 if Current Limited to I
AS
• Photo Current
Star*Power Gold products. Star*Power FETs are optimized
- 1.5nA Per-rad (Si)/s Typically
for total dose and r
performance while exhibiting SEE
DS(ON)
• Neutron
capability at full rated voltage up to an LET of 37. Star*Power
Gold FETs have been optimized for SEE and Gate Charge
providing SEE performance to 80% of the rated voltage for
an LET of 82 with extremely low gate charge characteristics.
- Maintain Pre-rad Specifications
for 3E13 Neutrons/cm
2
2
- Usable to 3E14 Neutrons/cm
Symbol
This MOSFET is an enhancement-mode silicon-gate power
field effect transistor of the vertical DMOS (VDMOS)
structure. It is specifically designed and processed to be
radiation tolerant. The MOSFET is well suited for
applications exposed to radiation environments such as
switching regulation, switching converters, power
distribution, motor drives and relay drivers as well as other
power control and conditioning applications. As with
conventional MOSFETs these Radiation Hardened
MOSFETs offer ease of voltage control, fast switching
speeds and ability to parallel switching devices.
D
G
S
Packaging
SMD.5
Reliability screening is available as either TXV or Space
equivalent of MIL-PRF-19500.
Formerly available as type TA45212W.
Ordering Information
RAD LEVEL SCREENING LEVEL PART NUMBER/BRAND
10K
Engineering Samples FSPYE130D1
100K
100K
300K
300K
TXV
Space
TXV
FSPYE130R3
FSPYE130R4
FSPYE130F3
FSPYE130F4
Space
©2001 Fairchild Semiconductor Corporation
FSPYE130R, FSPYE130F Rev. B