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FQD19N10LTM PDF预览

FQD19N10LTM

更新时间: 2024-11-21 14:55:43
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
8页 345K
描述
功率 MOSFET,N 沟道,逻辑电平,QFET?,100 V,15.6 A,100 mΩ,DPAK

FQD19N10LTM 技术参数

是否无铅: 不含铅生命周期:Active
包装说明:SMALL OUTLINE, R-PSSO-G2Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8541.29.00.95
Factory Lead Time:1 week风险等级:0.91
雪崩能效等级(Eas):220 mJ外壳连接:DRAIN
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:100 V
最大漏极电流 (Abs) (ID):15.6 A最大漏极电流 (ID):15.6 A
最大漏源导通电阻:0.11 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JEDEC-95代码:TO-252JESD-30 代码:R-PSSO-G2
JESD-609代码:e3湿度敏感等级:1
元件数量:1端子数量:2
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):50 W
最大脉冲漏极电流 (IDM):62.4 A认证状态:Not Qualified
子类别:FET General Purpose Power表面贴装:YES
端子面层:Tin (Sn)端子形式:GULL WING
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

FQD19N10LTM 数据手册

 浏览型号FQD19N10LTM的Datasheet PDF文件第2页浏览型号FQD19N10LTM的Datasheet PDF文件第3页浏览型号FQD19N10LTM的Datasheet PDF文件第4页浏览型号FQD19N10LTM的Datasheet PDF文件第5页浏览型号FQD19N10LTM的Datasheet PDF文件第6页浏览型号FQD19N10LTM的Datasheet PDF文件第7页 
DATA SHEET  
www.onsemi.com  
MOSFET – N-Channel, QFET  
100 V, 15.6 A, 100 mW  
V
R
MAX  
I MAX  
D
DSS  
DS(on)  
100 V  
100 mW @ 10 V  
15.6 A  
FQD19N10L  
D
Description  
This N−Channel enhancement mode power MOSFET is produced  
using onsemis proprietary planar stripe and DMOS technology. This  
advanced MOSFET technology has been especially tailored to reduce  
on−state resistance, and to provide superior switching performance  
and high avalanche energy strength. These devices are suitable for  
switched mode power supplies, audio amplifier, DC motor control,  
and variable switching power applications.  
G
S
DPAK3 (TO−252 3 LD)  
CASE 369AS  
MARKING DIAGRAM  
Features  
&Z&3&K  
FQD  
19N10L  
15.6 A, 100 V, R  
= 100 mΩ (Max.) @ V = 10 V  
GS  
DS(on)  
Low Gate Charge (Typ. 14 nC)  
Low Crss (Typ. 35 pF)  
&Z  
&3  
&K  
= Assembly Plant Code  
= 3−Digit Date Code  
= 2−Digits Lot Run Traceability Code  
100% Avalanche Tested  
FQD19N10L = Device Code  
ABSOLUTE MAXIMUM RATINGS (T = 25°C, unless otherwise noted)  
C
Symbol  
Parameter  
Drain−Source Voltage  
Ratings  
100  
15.6  
9.8  
Unit  
V
V
DSS  
D
I
D
Drain Current − Continuous (T = 25°C)  
A
C
− Continuous (T = 100°C)  
A
C
I
Drain Current − Pulsed (Note 1)  
Gate−Source Voltage  
62.4  
20  
A
DM  
G
V
GSS  
V
E
Single Pulsed Avalanche Energy (Note 2)  
Avalanche Current (Note 1)  
220  
15.6  
5.0  
mJ  
A
AS  
AR  
I
S
E
AR  
Repetitive Avalanche Energy (Note 1)  
Peak Diode Recovery dv/dt (Note 3)  
mJ  
V/ns  
W
N−Channel MOSFET  
dv/dt  
6.0  
P
Power Dissipation (T = 25°C) *  
2.5  
D
A
Power Dissipation (T = 25°C)  
50  
W
ORDERING INFORMATION  
See detailed ordering and shipping information on page 6 of  
this data sheet.  
C
− Derate Above 25°C  
0.4  
W/°C  
°C  
°C  
T , T  
Operating and Storage Temperature Range −55 to +150  
J
STG  
T
L
Maximum Lead Temperature for Soldering,  
1/8” from Case for 5 Seconds  
300  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Ratings  
2.5  
Unit  
Thermal Resistance Junction to Case, Max.  
°C/W  
R
q
JC  
R
q
JA  
Thermal Resistance, Junction to Ambient  
(Minimum Pad of 2−oz Copper), Max.  
110  
Thermal Resistance, Junction to Ambient  
(*1 in Pad of 2−oz Copper), Max.  
50  
2
© Semiconductor Components Industries, LLC, 2000  
1
Publication Order Number:  
September, 2023 − Rev. 3  
FQD19N10L/D  

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