DATA SHEET
www.onsemi.com
MOSFET – N-Channel, QFET
100 V, 15.6 A, 100 mW
V
R
MAX
I MAX
D
DSS
DS(on)
100 V
100 mW @ 10 V
15.6 A
FQD19N10L
D
Description
This N−Channel enhancement mode power MOSFET is produced
using onsemi’s proprietary planar stripe and DMOS technology. This
advanced MOSFET technology has been especially tailored to reduce
on−state resistance, and to provide superior switching performance
and high avalanche energy strength. These devices are suitable for
switched mode power supplies, audio amplifier, DC motor control,
and variable switching power applications.
G
S
DPAK3 (TO−252 3 LD)
CASE 369AS
MARKING DIAGRAM
Features
&Z&3&K
FQD
19N10L
• 15.6 A, 100 V, R
= 100 mΩ (Max.) @ V = 10 V
GS
DS(on)
• Low Gate Charge (Typ. 14 nC)
• Low Crss (Typ. 35 pF)
&Z
&3
&K
= Assembly Plant Code
= 3−Digit Date Code
= 2−Digits Lot Run Traceability Code
• 100% Avalanche Tested
FQD19N10L = Device Code
ABSOLUTE MAXIMUM RATINGS (T = 25°C, unless otherwise noted)
C
Symbol
Parameter
Drain−Source Voltage
Ratings
100
15.6
9.8
Unit
V
V
DSS
D
I
D
Drain Current − Continuous (T = 25°C)
A
C
− Continuous (T = 100°C)
A
C
I
Drain Current − Pulsed (Note 1)
Gate−Source Voltage
62.4
20
A
DM
G
V
GSS
V
E
Single Pulsed Avalanche Energy (Note 2)
Avalanche Current (Note 1)
220
15.6
5.0
mJ
A
AS
AR
I
S
E
AR
Repetitive Avalanche Energy (Note 1)
Peak Diode Recovery dv/dt (Note 3)
mJ
V/ns
W
N−Channel MOSFET
dv/dt
6.0
P
Power Dissipation (T = 25°C) *
2.5
D
A
Power Dissipation (T = 25°C)
50
W
ORDERING INFORMATION
See detailed ordering and shipping information on page 6 of
this data sheet.
C
− Derate Above 25°C
0.4
W/°C
°C
°C
T , T
Operating and Storage Temperature Range −55 to +150
J
STG
T
L
Maximum Lead Temperature for Soldering,
1/8” from Case for 5 Seconds
300
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
THERMAL CHARACTERISTICS
Symbol
Parameter
Ratings
2.5
Unit
Thermal Resistance Junction to Case, Max.
°C/W
R
q
JC
R
q
JA
Thermal Resistance, Junction to Ambient
(Minimum Pad of 2−oz Copper), Max.
110
Thermal Resistance, Junction to Ambient
(*1 in Pad of 2−oz Copper), Max.
50
2
© Semiconductor Components Industries, LLC, 2000
1
Publication Order Number:
September, 2023 − Rev. 3
FQD19N10L/D