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FQD19N10LTM PDF预览

FQD19N10LTM

更新时间: 2023-12-06 20:11:17
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
8页 345K
描述
功率 MOSFET,N 沟道,逻辑电平,QFET?,100 V,15.6 A,100 mΩ,DPAK

FQD19N10LTM 数据手册

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DATA SHEET  
www.onsemi.com  
MOSFET – N-Channel, QFET  
100 V, 15.6 A, 100 mW  
V
R
MAX  
I MAX  
D
DSS  
DS(on)  
100 V  
100 mW @ 10 V  
15.6 A  
FQD19N10L  
D
Description  
This N−Channel enhancement mode power MOSFET is produced  
using onsemis proprietary planar stripe and DMOS technology. This  
advanced MOSFET technology has been especially tailored to reduce  
on−state resistance, and to provide superior switching performance  
and high avalanche energy strength. These devices are suitable for  
switched mode power supplies, audio amplifier, DC motor control,  
and variable switching power applications.  
G
S
DPAK3 (TO−252 3 LD)  
CASE 369AS  
MARKING DIAGRAM  
Features  
&Z&3&K  
FQD  
19N10L  
15.6 A, 100 V, R  
= 100 mΩ (Max.) @ V = 10 V  
GS  
DS(on)  
Low Gate Charge (Typ. 14 nC)  
Low Crss (Typ. 35 pF)  
&Z  
&3  
&K  
= Assembly Plant Code  
= 3−Digit Date Code  
= 2−Digits Lot Run Traceability Code  
100% Avalanche Tested  
FQD19N10L = Device Code  
ABSOLUTE MAXIMUM RATINGS (T = 25°C, unless otherwise noted)  
C
Symbol  
Parameter  
Drain−Source Voltage  
Ratings  
100  
15.6  
9.8  
Unit  
V
V
DSS  
D
I
D
Drain Current − Continuous (T = 25°C)  
A
C
− Continuous (T = 100°C)  
A
C
I
Drain Current − Pulsed (Note 1)  
Gate−Source Voltage  
62.4  
20  
A
DM  
G
V
GSS  
V
E
Single Pulsed Avalanche Energy (Note 2)  
Avalanche Current (Note 1)  
220  
15.6  
5.0  
mJ  
A
AS  
AR  
I
S
E
AR  
Repetitive Avalanche Energy (Note 1)  
Peak Diode Recovery dv/dt (Note 3)  
mJ  
V/ns  
W
N−Channel MOSFET  
dv/dt  
6.0  
P
Power Dissipation (T = 25°C) *  
2.5  
D
A
Power Dissipation (T = 25°C)  
50  
W
ORDERING INFORMATION  
See detailed ordering and shipping information on page 6 of  
this data sheet.  
C
− Derate Above 25°C  
0.4  
W/°C  
°C  
°C  
T , T  
Operating and Storage Temperature Range −55 to +150  
J
STG  
T
L
Maximum Lead Temperature for Soldering,  
1/8” from Case for 5 Seconds  
300  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Ratings  
2.5  
Unit  
Thermal Resistance Junction to Case, Max.  
°C/W  
R
q
JC  
R
q
JA  
Thermal Resistance, Junction to Ambient  
(Minimum Pad of 2−oz Copper), Max.  
110  
Thermal Resistance, Junction to Ambient  
(*1 in Pad of 2−oz Copper), Max.  
50  
2
© Semiconductor Components Industries, LLC, 2000  
1
Publication Order Number:  
September, 2023 − Rev. 3  
FQD19N10L/D  

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