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FQD16N25C_12 PDF预览

FQD16N25C_12

更新时间: 2024-11-24 11:59:23
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
8页 842K
描述
250V N-Channel MOSFET

FQD16N25C_12 数据手册

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September 2012  
®
QFET  
FQD16N25C  
250V N-Channel MOSFET  
tm  
Features  
Description  
16A, 250V, RDS(on) = 0.27Ω @VGS = 10 V  
Low gate charge ( typical 41 nC)  
Low Crss ( typical 68 pF)  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
RoHS compliant  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These devices are well suited for high  
efficiency switching DC/DC converters, switch mode power  
supplies, DC-AC converters for uninterrupted power supplies  
and motor controls.  
D
D
G
D-PAK  
FQD Series  
G
S
S
Absolute Maximum Ratings  
Symbol  
Parameter  
FQD16N25C  
Units  
V
VDSS  
ID  
Drain-Source Voltage  
250  
16  
Drain Current  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
- Pulsed  
A
10.1  
64  
A
(Note 1)  
IDM  
Drain Current  
A
VGSS  
EAS  
IAR  
Gate-Source Voltage  
± 30  
432  
V
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
16  
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
Power Dissipation (TC = 25°C)  
160  
mJ  
V/ns  
W
5.5  
160  
- Derate above 25°C  
1.28  
-55 to +150  
W/°C  
°C  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
Maximum lead temperature for soldering purposes,  
1/8" from case for 5 seconds  
300  
°C  
Thermal Characteristics  
Symbol  
Parameter  
FQD16N25C  
Units  
°C/W  
RθJC  
RθJA  
Thermal Resistance, Junction-to-Case  
0.78  
110  
Thermal Resistance, Junction-to-Ambient  
°C/W  
©2012 Fairchild Semiconductor Corporation  
FQD16N25C Rev. C0  
1
www.fairchildsemi.com  

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