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DF2S5M4SL PDF预览

DF2S5M4SL

更新时间: 2024-01-05 20:57:02
品牌 Logo 应用领域
东芝 - TOSHIBA 局域网光电二极管电视
页数 文件大小 规格书
8页 311K
描述
30W, UNIDIRECTIONAL, SILICON, TVS DIODE

DF2S5M4SL 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:R-PDSO-N2Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.10.00.50
风险等级:5.76最大击穿电压:5.5 V
最小击穿电压:3.7 V配置:SINGLE
二极管元件材料:SILICON二极管类型:TRANS VOLTAGE SUPPRESSOR DIODE
JESD-30 代码:R-PDSO-N2最大非重复峰值反向功率耗散:30 W
元件数量:1端子数量:2
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED极性:UNIDIRECTIONAL
参考标准:IEC-61000-4-5最大重复峰值反向电压:3.6 V
表面贴装:YES技术:AVALANCHE
端子形式:NO LEAD端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIEDBase Number Matches:1

DF2S5M4SL 数据手册

 浏览型号DF2S5M4SL的Datasheet PDF文件第2页浏览型号DF2S5M4SL的Datasheet PDF文件第3页浏览型号DF2S5M4SL的Datasheet PDF文件第4页浏览型号DF2S5M4SL的Datasheet PDF文件第5页浏览型号DF2S5M4SL的Datasheet PDF文件第6页浏览型号DF2S5M4SL的Datasheet PDF文件第7页 
DF2S5M4SL  
ESD Protection Diodes Silicon Epitaxial Planar  
DF2S5M4SL  
1. Applications  
ESD Protection  
Note: This product is designed for protection against electrostatic discharge (ESD) and is not intended for any other  
purpose, including, but not limited to, voltage regulation.  
2. Packaging and Internal Circuit  
1: Cathode  
2: Anode  
SL2  
3. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )  
Characteristics  
Symbol  
Note  
Rating  
Unit  
kV  
Electrostatic discharge voltage (IEC61000-4-2)(Contact)  
Electrostatic discharge voltage (IEC61000-4-2)(Air)  
Peak pulse power (tp = 8/20 µs)  
VESD  
(Note 1)  
±20  
PPK  
IPP  
Tj  
30  
2.0  
W
A
Peak pulse current (tp = 8/20 µs)  
Junction temperature  
(Note 2)  
150  
Storage temperature  
Tstg  
-55 to 150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: According to IEC61000-4-2.  
Note 2: According to IEC61000-4-5.  
Start of commercial production  
2016-03  
©2016 Toshiba Corporation  
2016-03-25  
Rev.1.0  
1

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