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CXK77Q18R160GB-3 PDF预览

CXK77Q18R160GB-3

更新时间: 2024-11-09 09:42:27
品牌 Logo 应用领域
索尼 - SONY 静态存储器
页数 文件大小 规格书
23页 161K
描述
Standard SRAM, 1MX18, 1.8ns, CMOS, PBGA119, 14 X 22 MM, 1.27 MM PITCH, BGA-119

CXK77Q18R160GB-3 数据手册

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SONYÒ CXK77Q36R160GB / CXK77Q18R160GB  
3/33/4  
16Mb LW R-R HSTL High Speed Synchronous SRAMs (512K x 36 or 1M x 18)  
Preliminary  
Description  
The CXK77Q36R160GB (organized as 524,288 words by 36 bits) and the CXK77Q18R160GB (organized as 1,048,576 words  
by 18 bits) are high speed CMOS synchronous static RAMs with common I/O pins. These synchronous SRAMs integrate input  
registers, high speed RAM, output registers, and a one-deep write buffer onto a single monolithic IC. Register - Register (R-R)  
read operations and Late Write (LW) write operations are supported, providing a high-performance user interface.  
All address and control input signals except G (Output Enable) and ZZ (Sleep Mode) are registered on the rising edge of K  
(Input Clock).  
During read operations, output data is driven valid from the rising edge of K, one full clock cycle after the address is registered.  
During write operations, input data is registered on the rising edge of K, one full clock cycle after the address is registered.  
The output drivers are series terminated, and the output impedance is programmable through an external impedance matching  
resistor RQ. By connecting RQ between ZQ and V , the output impedance of all DQ pins can be precisely controlled.  
SS  
Sleep (power down) mode control is provided through the asynchronous ZZ input. 333 MHz operation is obtained from a single  
2.5V power supply. JTAG boundary scan interface is provided using a subset of IEEE standard 1149.1 protocol.  
Features  
3 Speed Bins  
Cycle Time / Access Time  
3.0ns / 1.8ns  
-3  
-33  
-4  
3.3ns / 1.9ns  
4.0ns / 2.0ns  
Single 2.5V power supply (V ): 2.5V ± 5%  
DD  
Dedicated output supply voltage (V  
): 1.5V typical  
DDQ  
HSTL-compatible I/O interface with dedicated input reference voltage (V ): 0.75V typical  
REF  
Register - Register (R-R) read operations  
Late Write (LW)  
Full read/write coherency  
Byte Write capability  
Two cycle deselect  
Differential input clocks (K/K)  
Asynchronous output enable (G)  
Programmable impedance output drivers  
Sleep (power down) mode via dedicated mode pin (ZZ)  
JTAG boundary scan (subset of IEEE standard 1149.1)  
119 pin (7x17), 1.27mm pitch, 14mm x 22mm Ball Grid Array (BGA) package  
16Mb LW R-R, rev 0.1  
1 / 23  
August 20, 2001  

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