Features
■ Low capacitance - 0.3 pF
■ ESD protection
Applications
■ USB 3.0
■ HDMI 1.4
■ Vcc + six I/O data lines
■ RoHS compliant*
■ High speed port protection
■ Portable electronics
CDDFN10-0506N - TVS/Steering Diode Array
General Information
®
The Bourns Model CDDFN10-0506N device provides ESD and
EFT protection for high speed data ports meeting IEC 61000-4-2
(ESD) and IEC 61000-4-4 (EFT) requirements. The Transient
Voltage Suppressor array, protecting up to six data lines, offers a
Working Peak Voltage of 5.0 V.
2
1
4
5
6
7
10
The DFN-10 package is easy to handle with standard pick and
place equipment and their flat configuration minimizes roll away.
9
Absolute Maximum Ratings, T = 25 °C (Unless Otherwise Noted)
A
Parameter
Peak Pulse Current (t = 8/20 μS)
Symbol
Rating
3.5
Unit
A
I
p
pp
Peak Pulse Current (t = 8/20 μS)
P
40
6
W
V
p
pk
Operating Supply Votage (V - Gnd)
V
dd
DC
DC Voltage on any I/O Pad
Storage Temperature
Operating Temperature
V
(Gnd -0.5) to (V +0.5)
V
ºC
ºC
IO
dd
T
STG
-55 to +150
-40 to +85
T
OPR
Electrical Characteristics (@ T = 25 °C Unless Otherwise Noted)
A
Parameter
Working Peak Voltage
Symbol
Min.
Typ.
Max.
5.0
Unit
V
1
V
WM
1
Breakdown Voltage @ 1 mA
V
6.0
V
BR
2
Forward Voltage @ 15 mA
V
0.8
1.2
2.5
1
V
F
1
Leakage Current @ V
Leakage Current @ V
I
μA
μA
pF
WM
L
3
I
WM
3
IO
Channel Capacitance @ 2.5 V, 1 MHz
Channel to Channel Capacitance
C
0.25
0.05
0.35
IO
4
C
0.07
pF
CROSS
@ 2.5 V, 1 MHz
ESD Protection per IEC 61000-4-2
Contact Discharge
8
kV
kV
Ω
Ω
A
Air Discharge
15
5
ESD Dynamic Turn-on Resistance
R
0.35
0.2
dynamic_I/O
6
ESD Dynamic Turn-on Resistance
R
dynamic_VDD
EFT Protection per IEC 61000-4-4 @ 5/50 ns
40
Note 1: Pin 2 to Pin 9
Note 4: Between I/O 1, 4, 5, 6, 7 or 10.
Note 5: Any I/O Pin to Ground.
Note 2: Pin 9 to Pin 2.
Note 3: Pin 1, 4, 5, 6, 7 or 10 to Ground.
Note 6: V Pin to Ground.
DD
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.