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APTM100H45SCTG-Module PDF预览

APTM100H45SCTG-Module

更新时间: 2024-11-25 14:53:19
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美国微芯 - MICROCHIP /
页数 文件大小 规格书
9页 693K
描述
MOSFETsLow RDSonLow input and Miller capacitanceLow gate chargeAvalanche energy ratedVery ruggedKe

APTM100H45SCTG-Module 数据手册

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APTM100H45SCTG  
VDSS = 1000V  
DSon = 450mΩ typ @ Tj = 25°C  
ID = 18A @ Tc = 25°C  
Full bridge Series & SiC parallel diodes  
MOSFET Power Module  
R
VBUS  
Application  
Motor control  
Switched Mode Power Supplies  
Uninterruptible Power Supplies  
CR1A  
CR3A  
CR1B CR3B  
OUT1 OUT2  
Q1  
Q3  
Features  
G3  
S3  
Power MOS 7® MOSFETs  
G1  
S1  
-
-
-
-
Low RDSon  
Low input and Miller capacitance  
Low gate charge  
CR2A  
CR4A  
CR2B CR4B  
Q2  
Q4  
Avalanche energy rated  
G4  
S4  
Parallel SiC Schottky Diode  
G2  
S2  
-
Zero reverse recovery  
-
-
-
Zero forward recovery  
Temperature Independent switching behavior  
Positive temperature coefficient on VF  
0/VBUS  
NTC1  
NTC2  
Kelvin source for easy drive  
Very low stray inductance  
-
-
Symmetrical design  
Lead frames for power connections  
Internal thermistor for temperature monitoring  
High level of integration  
Benefits  
Outstanding performance at high frequency operation  
Direct mounting to heatsink (isolated package)  
Low junction to case thermal resistance  
Solderable terminals both for power and signal for  
easy PCB mounting  
Low profile  
RoHS Compliant  
All ratings @ Tj = 25°C unless otherwise specified  
Absolute maximum ratings  
Symbol  
Parameter  
Max ratings  
Unit  
VDSS  
Drain - Source Breakdown Voltage  
1000  
18  
14  
V
Tc = 25°C  
Tc = 80°C  
ID  
Continuous Drain Current  
A
IDM  
VGS  
RDSon  
Pulsed Drain current  
Gate - Source Voltage  
Drain - Source ON Resistance  
72  
±30  
540  
V
mΩ  
W
Tc = 25°C  
PD  
IAR  
EAR  
EAS  
Maximum Power Dissipation  
357  
18  
50  
Avalanche current (repetitive and non repetitive)  
Repetitive Avalanche Energy  
Single Pulse Avalanche Energy  
A
mJ  
2500  
These Devices are sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed. See application note  
APT0502 on www.microsemi.com  
1 – 9  
www.microsemi.com  

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