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2SC3303-Y(T6L1,NQ) PDF预览

2SC3303-Y(T6L1,NQ)

更新时间: 2024-11-29 21:09:51
品牌 Logo 应用领域
东芝 - TOSHIBA 开关晶体管
页数 文件大小 规格书
5页 162K
描述
TRANSISTOR NPN 80V 5A PW-MOLD

2SC3303-Y(T6L1,NQ) 技术参数

生命周期:Active包装说明:SMALL OUTLINE, R-PSSO-G2
Reach Compliance Code:unknown风险等级:5.66
外壳连接:COLLECTOR最大集电极电流 (IC):5 A
集电极-发射极最大电压:80 V配置:SINGLE
最小直流电流增益 (hFE):120JESD-30 代码:R-PSSO-G2
元件数量:1端子数量:2
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN功耗环境最大值:1 W
最大功率耗散 (Abs):20 W表面贴装:YES
端子形式:GULL WING端子位置:SINGLE
晶体管应用:SWITCHING晶体管元件材料:SILICON
标称过渡频率 (fT):120 MHzVCEsat-Max:0.4 V
Base Number Matches:1

2SC3303-Y(T6L1,NQ) 数据手册

 浏览型号2SC3303-Y(T6L1,NQ)的Datasheet PDF文件第2页浏览型号2SC3303-Y(T6L1,NQ)的Datasheet PDF文件第3页浏览型号2SC3303-Y(T6L1,NQ)的Datasheet PDF文件第4页浏览型号2SC3303-Y(T6L1,NQ)的Datasheet PDF文件第5页 
2SC3303  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process)  
2SC3303  
Industrial Applications  
Unit: mm  
High Current Switching Applications  
DC-DC Converter Applications  
Low collector saturation voltage: V  
= 0.4 V (max) (I = 3 A)  
CE (sat) C  
High speed switching time: t  
= 1.0 μs (typ.)  
stg  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
100  
V
V
V
Collector-emitter voltage  
Emitter-base voltage  
80  
7
DC  
I
5
C
Collector current  
Base current  
A
A
Pulse  
I
8
CP  
I
1
1.0  
B
Ta = 25°C  
Tc = 25°C  
Collector power  
dissipation  
P
W
C
20  
JEDEC  
JEITA  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
55 to 150  
stg  
TOSHIBA  
2-7J1A  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
Weight: 0.36 g (typ.)  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are  
within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/”Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2010-02-05  

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