1N6626-1N6631
ULTRA FAST RECTIFIERS
High-reliability discrete products
and engineering services since 1977
FEATURES
Available as “HR” (high reliability) screened per MIL-PRF-19500, JANTX level. Add “HR” suffix to base part number.
Available as non-RoHS (Sn/Pb plating), standard, and as RoHS by adding “-PBF” suffix.
MAXIMUM RATINGS
Rating
Value
Junction temperature
Storage temperature
-65° to 150°C
-65° to 175°C
Peak forward surge current @ 25°C (1)
1N6626-1N6630
75A
60A
1N6631
Average rectified forward current @ TL = 75°C(2)
1N6626-1N6628
2.3A
1.8A
1N6629-1N6631
Average rectified forward current at TA = 25°C(3)
1N6626-1N6628
1.75A
1.40A
1N6629-1N6631
Thermal resistance L = 0.375”
Capacitance at VR = 10V
Solder temperature
22°C/W
40pF
260°C for 10 s maximum
Note 1: Test pulse = 8.3 ms, half-sine wave.
Note 2: Derate linearly at 1.0%/°C for TL > 75°.
Note 3: Derate linearly at 0.80%/°C for TA > 25°C. This is typical for PC boards where thermal resistance from mounting point to ambient is sufficiently controlled where TJ(max) is not exceeded.
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)
Maximum
reverse
recovery
time
Maximum
reverse
recovery
time
Working
peak
reverse
voltage
Maximum
forward
Recovery
Voltage
Minimum
breakdown
voltage
Peak
Recovery
Current (2)
Maximum reverse
current
Max forward voltage
(low
(high
current) (1)
current)(2)
Part
number
IRM (rec)
VFRM
VR
IR @ VRWM
VRWM
trr
trr
IF = 0.5A
IF = 2A
100A/μS
IR = 50μA
V
VF @ IF
TA=25°C
μA
TA=150°C
μA
tr = 12ns
V
V@A
V@A
ns
30
30
30
50
50
60
ns
45
45
45
60
60
80
A
V
8
1N6626
1N6627
1N6628
1N6629
1N6630
1N6631
200
400
600
800
900
1000
220
1.35V@2.0A
1.35V@2.0A
1.35V@2.0A
1.40V@1.4A
1.40V@1.4A
1.60V@1.4A
1.50V@4.0A
1.50V@4.0A
1.50V@4.0A
1.70V@3.0A
1.70V@3.0A
1.95V@2.0A
2.0
500
3.5
3.5
3.5
4.2
4.2
5.0
440
2.0
500
8
660
2.0
500
8
880
2.0
500
12
12
20
990
2.0
500
1100
4.0
600
Note 1: Low Current Reverse Recovery Time Test Conditions IF = 0.5A, IRM = 1.0A, IR(REC) = 0.25A.
Note 2: High Current Reverse Recovery Time Test Conditions IF = 2.0A, 100A/µs, MIL-STD-750, METHOD 4031, CONDITION D.
Rev. 20131216