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DAC8830-EP
DAC8831-EP
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SGLS334C–AUGUST 2006–REVISED APRIL 2007
16-Bit, Ultra-Low Power, Voltage-Output
Digital-to-Analog Converters
FEATURES
APPLICATIONS
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Portable Equipment
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Controlled Baseline
Automatic Test Equipment
Industrial Process Control
Data Acquisition Systems
Optical Networking
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One Assembly
One Test Site
One Fabrication Site
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Extended Temperature Performance of –55°C
to 125°C
DESCRIPTION
Enhanced Diminishing Manufacturing Sources
(DMS) Support
The DAC8830 and DAC8831 are single, 16-bit,
serial-input,
voltage-output
digital-to-analog
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Enhanced Product-Change Notification
converters (DACs) operating from a single 3-V to 5-V
power supply. These converters provide excellent
linearity, low glitch, low noise, and fast settling over
the specified temperature range of –55°C to 125°C.
The output is unbuffered, which reduces the power
consumption and the error introduced by the buffer.
(1)
Qualification Pedigree
16-Bit Resolution
2.7-V to 5.5-V Single-Supply Operation
Low Power: 15 μW for 3-V Power
High Accuracy, INL: 1 LSB
Low Glitch: 8 nV-s
These parts feature a standard high-speed (clock up
to 50 MHz), 3-V or 5-V SPI serial interface to
communicate with the DSP or microprocessors.
Low Noise: 10 nV/√Hz
Fast Settling: 1 μs
The DAC8830 output is 0 V to VREF. However, the
DAC8831 provides bipolar mode output (±VREF
when working with an external buffer. The DAC8830
and DAC8831 are both reset to zero-code after
power up.
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Fast SPI Interface Up to 50 MHz
Reset to Zero-Code
Schmitt-Trigger Inputs for Direct Optocoupler
Interface
For optimum performance,
connections to external reference and analog ground
input are provided on the DAC8831.
a
set of Kelvin
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Industry-Standard Pin Configuration
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
The DAC8830 is available in an SO-8 package and
the DAC8831 is available in an SO-14 package. Both
have industry standard pinouts (see Table 3, the
Cross Reference table in the Application Information
section for details).
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2006–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.