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V62/06671-04YE

更新时间： 2024-02-24 03:05:23
品牌 Logo 应用领域
德州仪器 - TI 转换器数模转换器光电二极管
页数 文件大小 规格书
32页 921K
描述
16-Bit, Ultra-Low Power, Voltage-Output Digital-to-Analog Converters

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V62/06671-04YE 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Active零件包装代码：SOIC
包装说明：SOP, SOP14,.25针数：14
Reach Compliance Code：compliantECCN代码：3A001.A.2.C
HTS代码：8542.39.00.01风险等级：5.22
Is Samacsys：N最大模拟输出电压：5.5 V
最小模拟输出电压：-5.5 V转换器类型：D/A CONVERTER
输入位码：BINARY输入格式：SERIAL
JESD-30 代码：R-PDSO-G14JESD-609代码：e4
长度：8.65 mm最大线性误差 (EL)：0.0023%
湿度敏感等级：3位数：16
功能数量：1端子数量：14
最高工作温度：125 °C最低工作温度：-55 °C
封装主体材料：PLASTIC/EPOXY封装代码：SOP
封装等效代码：SOP14,.25封装形状：RECTANGULAR
封装形式：SMALL OUTLINE峰值回流温度（摄氏度）：260
电源：3/5 V认证状态：Not Qualified
采样速率：2 MHz座面最大高度：1.75 mm
标称安定时间 (tstl)：1 µs子类别：Other Converters
最大压摆率：0.02 mA标称供电电压：3 V
表面贴装：YES温度等级：MILITARY
端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)端子形式：GULL WING
端子节距：1.27 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED宽度：3.91 mm
Base Number Matches：1

V62/06671-04YE 数据手册

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DAC8830-EP  
DAC8831-EP  
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SGLS334C–AUGUST 2006–REVISED APRIL 2007  
16-Bit, Ultra-Low Power, Voltage-Output  
Digital-to-Analog Converters  
FEATURES  
APPLICATIONS  
•
•
•
•
•
Portable Equipment  
•
Controlled Baseline  
Automatic Test Equipment  
Industrial Process Control  
Data Acquisition Systems  
Optical Networking  
–
–
–
One Assembly  
One Test Site  
One Fabrication Site  
•
•
Extended Temperature Performance of –55°C  
to 125°C  
DESCRIPTION  
Enhanced Diminishing Manufacturing Sources  
(DMS) Support  
The DAC8830 and DAC8831 are single, 16-bit,  
serial-input,  
voltage-output  
digital-to-analog  
•
•
•
•
•
•
•
•
•
•
•
•
Enhanced Product-Change Notification  
converters (DACs) operating from a single 3-V to 5-V  
power supply. These converters provide excellent  
linearity, low glitch, low noise, and fast settling over  
the specified temperature range of –55°C to 125°C.  
The output is unbuffered, which reduces the power  
consumption and the error introduced by the buffer.  
(1)  
Qualification Pedigree  
16-Bit Resolution  
2.7-V to 5.5-V Single-Supply Operation  
Low Power: 15 μW for 3-V Power  
High Accuracy, INL: 1 LSB  
Low Glitch: 8 nV-s  
These parts feature a standard high-speed (clock up  
to 50 MHz), 3-V or 5-V SPI serial interface to  
communicate with the DSP or microprocessors.  
Low Noise: 10 nV/√Hz  
Fast Settling: 1 μs  
The DAC8830 output is 0 V to VREF. However, the  
DAC8831 provides bipolar mode output (±VREF  
when working with an external buffer. The DAC8830  
and DAC8831 are both reset to zero-code after  
power up.  
)
Fast SPI Interface Up to 50 MHz  
Reset to Zero-Code  
Schmitt-Trigger Inputs for Direct Optocoupler  
Interface  
For optimum performance,  
connections to external reference and analog ground  
input are provided on the DAC8831.  
a
set of Kelvin  
•
Industry-Standard Pin Configuration  
(1) Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
The DAC8830 is available in an SO-8 package and  
the DAC8831 is available in an SO-14 package. Both  
have industry standard pinouts (see Table 3, the  
Cross Reference table in the Application Information  
section for details).  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2006–2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
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