Typical Size
6,4 mm X 9,7 mm
TPS54610-EP
www.ti.com
SGLS294A–FEBRUARY 2005–REVISED AUGUST 2007
3 V TO 6 V INPUT, 6 A OUTPUT SYNCHRONOUS BUCK PWM
SWITCHER WITH INTEGRATED FETs (SWIFT™)
1
FEATURES
APPLICATIONS
•
Low-Voltage, High-Density Distributed Power
Systems
2
•
Controlled Baseline
–
One Assembly/Test Site, One Fabrication
Site
•
Point-of-Load Regulation for High-
Performance DSPs, FPGAs, ASICs, and
Microprocessors
Broadband, Networking, and Optical
Communications Infrastructure
•
•
Extended Temperature Performance of –55°C
to 125°C
•
•
Enhanced Diminishing Manufacturing Sources
(DMS) Support
Portable Computing/Notebook PCs
•
•
•
Enhanced Product-Change Notification
(1)
DESCRIPTION/ORDERING INFORMATION
Qualification Pedigree
30 mΩ, 12 A Peak MOSFET Switches for High
Efficiency at 6 A Continuous Output Source or
Sink Current
As a member of the SWIFT™ family of dc/dc
regulators, the TPS54610 low-input voltage
high-output current synchronous buck PWM
converter integrates all required active components.
Included on the substrate with the listed features are
a true, high-performance, voltage error amplifier that
enables maximum performance and flexibility in
choosing the output filter L and C components, an
under-voltage-lockout circuit to prevent start-up until
the input voltage reaches 3 V, an internally or
externally set slow-start circuit to limit inrush currents,
and a power good output useful for processor/logic
reset, fault signaling, and supply sequencing.
•
•
Adjustable Output Voltage Down to 0.9 V With
1% Accuracy
Wide PWM Frequency: Fixed 350 kHz, 550 kHz
or Adjustable 280 kHz to 700 kHz
•
•
Synchronizable to 700 kHz
Load Protected by Peak Current Limit and
Thermal Shutdown
•
Integrated Solution Reduces Board Area and
Component Count
The TPS54610 is available in a thermally enhanced
28-pin TSSOP (PWP) PowerPAD™ package, which
eliminates bulky heatsinks. Texas Instruments
provides evaluation modules and the SWIFT™
designer software tool to aid in quickly achieving
high-performance power supply designs to meet
aggressive equipment development cycles.
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
SWIFT, PowerPAD are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2007, Texas Instruments Incorporated