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TPCA8109 PDF预览

TPCA8109

更新时间: 2024-01-28 01:17:06
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体晶体管功率场效应晶体管开关脉冲光电二极管
页数 文件大小 规格书
7页 232K
描述
Silicon P Channel MOS Type (U-MOSⅥ)

TPCA8109 技术参数

生命周期:Active包装说明:SMALL OUTLINE, S-PDSO-F5
针数:8Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.69
雪崩能效等级(Eas):75 mJ外壳连接:DRAIN
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:30 V
最大漏极电流 (ID):24 A最大漏源导通电阻:0.013 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:S-PDSO-F5
元件数量:1端子数量:5
工作模式:ENHANCEMENT MODE封装主体材料:PLASTIC/EPOXY
封装形状:SQUARE封装形式:SMALL OUTLINE
极性/信道类型:P-CHANNEL最大脉冲漏极电流 (IDM):72 A
认证状态:Not Qualified表面贴装:YES
端子形式:FLAT端子位置:DUAL
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

TPCA8109 数据手册

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TPCA8109  
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOS)  
TPCA8109  
Lithium Ion Battery Applications  
Unit: mm  
Power Management Switch Applications  
0.4 ± 0.1  
1.27  
8
0.05 M A  
5
Small footprint due to small and thin package  
Low drain-source ON-resistance: R = 7 m(typ.)  
0.15 ± 0.05  
DS (ON)  
Low leakage current: I  
= 10 μA (max) (V  
= 30 V)  
DSS  
DS  
4
0.595  
A
Enhancement mode: V = 0.8 to 2.0 V (V  
= 10 V, I = 0.5mA)  
D
th  
DS  
1
Absolute Maximum Ratings (Ta = 25°C)  
5.0 ± 0.2  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
0.05 S  
S
V
30  
30  
V
V
V
DSS  
4
1
V
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
DGR  
GS  
V
25/+20  
24  
GSS  
4.25 ± 0.2  
DC  
(Note 1)  
I
D
Drain current  
A
Pulsed (Note 1)  
I
72  
DP  
8
5
Drain power dissipation  
Drain power dissipation  
(Tc=25°C)  
(t = 10 s)  
(Note 2a)  
(t = 10 s)  
(Note 2b)  
P
30  
W
W
D
D
P
2.8  
1.6  
75  
1,2,3SOURCE  
4GATE  
5,6,7,8DRAIN  
Drain power dissipation  
P
W
D
JEDEC  
JEITA  
Single pulse avalanche energy  
(Note 3)  
E
mJ  
AS  
TOSHIBA  
2-5Q1A  
Avalanche current  
I
24  
150  
A
AR  
T
°C  
°C  
Channel temperature  
Storage temperature range  
Weight: 0.076 g (typ.)  
ch  
T
55 to 150  
stg  
Note: For Notes 1 to 3, refer to the next page.  
Circuit Configuration  
Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the  
absolute maximum ratings. Please design the appropriate  
reliability upon reviewing the Toshiba Semiconductor Reliability  
Handbook (“Handling Precautions”/“Derating Concept and  
Methods”) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
8
7
6
5
1
2
3
4
This transistor is an electrostatic sensitive device. Please handle with  
caution.  
1
2009-12-03  

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