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TPCA8105(TE12L,Q) PDF预览

TPCA8105(TE12L,Q)

更新时间: 2024-02-09 03:46:09
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
7页 246K
描述
TRANSISTOR,MOSFET,P-CHANNEL,12V V(BR)DSS,6A I(D),SO

TPCA8105(TE12L,Q) 技术参数

是否Rohs认证: 符合生命周期:Obsolete
Reach Compliance Code:unknown风险等级:5.83
配置:Single最大漏极电流 (Abs) (ID):6 A
FET 技术:METAL-OXIDE SEMICONDUCTOR工作模式:ENHANCEMENT MODE
最高工作温度:150 °C极性/信道类型:P-CHANNEL
最大功率耗散 (Abs):20 W子类别:Other Transistors
表面贴装:YESBase Number Matches:1

TPCA8105(TE12L,Q) 数据手册

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TPCA8105  
TOSHIBA Field Effect Transistor Silicon P-Channel MOS Type (U-MOS III)  
TPCA8105  
Notebook PC Applications  
Unit: mm  
Portable Equipment Applications  
0.4±0.1  
1.27  
0.5±0.1  
0.05  
M A  
5
8
Small footprint due to compact and slim package  
Low drain-source ON-resistance : R = 23 m(typ.)  
DS (ON)  
0.15±0.05  
(V = 4.5V  
GS  
High forward transfer admittance :|Y | = 14 S (typ.)  
fs  
4
0.595  
A
1
Low leakage current : I  
Enhancement mode  
= 10 μA (V  
= 12 V)  
DSS  
DS  
5.0±0.2  
0.95±0.05  
0.166±0.05  
: V = 0.5 to 1.2 V (V  
= 10 V, I = 200 μA )  
D
th  
DS  
0.05  
S
S
1.1±0.2  
1
4
4.25±0.2  
8
5
0.8±0.1  
Absolute Maximum Ratings (Ta = 25°C)  
1, 2, 3: Source  
5, 6, 7, 8: Drain  
4: Gate  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
12  
12  
±8  
V
V
V
DSS  
JEDEC  
JEITA  
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
V
GS  
DGR  
V
GSS  
TOSHIBA  
2-5Q1A  
DC  
Drain current  
Pulse  
(Note 1)  
(Note 1)  
I
6  
D
A
I
24  
20  
Weight: 0.076 g (typ.)  
DP  
Drain power dissipation (Tc = 25°C)  
Drain power dissipation (t = 10 s)  
P
D
D
Circuit Configuration  
P
2.8  
1.6  
W
(Note 2a)  
8
7
6
5
Drain power dissipation (t = 10 s)  
(Note 2b)  
P
D
Single pulse avalanche energy  
E
25.1  
6  
mJ  
A
AS  
(Note 3)  
Avalanche current  
I
AR  
Repetitive avalanche energy  
E
0.8  
mJ  
AR  
(Tc = 25°C) (Note 4)  
Channel temperature  
Storage temperature range  
1
2
3
4
T
150  
°C  
°C  
ch  
T
55 to 150  
stg  
Note: For (Note 1), (Note 2), (Note 3), (Note 4), refer to the next page.  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability  
Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e.  
reliability test report and estimated failure rate, etc).  
This transistor is an electrostatic-sensitive device. Handle with caution.  
1
2010-03-02  

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