TPCA8105
TOSHIBA Field Effect Transistor Silicon P-Channel MOS Type (U-MOS III)
TPCA8105
Notebook PC Applications
Unit: mm
Portable Equipment Applications
0.4±0.1
1.27
0.5±0.1
0.05
M A
5
8
•
•
Small footprint due to compact and slim package
Low drain-source ON-resistance : R = 23 mΩ (typ.)
DS (ON)
0.15±0.05
(V = − 4.5V)
GS
•
•
•
High forward transfer admittance :|Y | = 14 S (typ.)
fs
4
0.595
A
1
Low leakage current : I
Enhancement mode
= −10 μA (V
= −12 V)
DSS
DS
5.0±0.2
0.95±0.05
0.166±0.05
: V = −0.5 to −1.2 V (V
= −10 V, I = −200 μA )
D
th
DS
0.05
S
S
1.1±0.2
1
4
4.25±0.2
8
5
0.8±0.1
Absolute Maximum Ratings (Ta = 25°C)
1, 2, 3: Source
5, 6, 7, 8: Drain
4: Gate
Characteristics
Drain-source voltage
Symbol
Rating
Unit
V
−12
−12
±8
V
V
V
DSS
JEDEC
JEITA
⎯
⎯
Drain-gate voltage (R
Gate-source voltage
= 20 kΩ)
V
GS
DGR
V
GSS
TOSHIBA
2-5Q1A
DC
Drain current
Pulse
(Note 1)
(Note 1)
I
−6
D
A
I
−24
20
Weight: 0.076 g (typ.)
DP
Drain power dissipation (Tc = 25°C)
Drain power dissipation (t = 10 s)
P
D
D
Circuit Configuration
P
2.8
1.6
W
(Note 2a)
8
7
6
5
Drain power dissipation (t = 10 s)
(Note 2b)
P
D
Single pulse avalanche energy
E
25.1
−6
mJ
A
AS
(Note 3)
Avalanche current
I
AR
Repetitive avalanche energy
E
0.8
mJ
AR
(Tc = 25°C) (Note 4)
Channel temperature
Storage temperature range
1
2
3
4
T
150
°C
°C
ch
T
−55 to 150
stg
Note: For (Note 1), (Note 2), (Note 3), (Note 4), refer to the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability
Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e.
reliability test report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with caution.
1
2010-03-02