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SSM6K32TU(TE85L) PDF预览

SSM6K32TU(TE85L)

更新时间: 2024-11-18 21:04:47
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
7页 399K
描述
TRANSISTOR,MOSFET,N-CHANNEL,60V V(BR)DSS,2A I(D),TSOP

SSM6K32TU(TE85L) 技术参数

是否Rohs认证: 不符合生命周期:Active
Reach Compliance Code:unknown风险等级:5.84
配置:Single最大漏极电流 (Abs) (ID):2 A
FET 技术:METAL-OXIDE SEMICONDUCTOR工作模式:ENHANCEMENT MODE
最高工作温度:150 °C极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):0.5 W子类别:FET General Purpose Power
表面贴装:YESBase Number Matches:1

SSM6K32TU(TE85L) 数据手册

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SSM6K32TU  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type  
SSM6K32TU  
Unit: mm  
Relay drive, DC-DC converter application  
z
z
4-V drive  
Low ON-resistance:  
R
= 440m(max) (@V  
= 4 V)  
GS  
DS(ON)  
R
= 300m(max) (@V  
= 10 V)  
GS  
DS(ON)  
Absolute Maximum Ratings (Ta = 25)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
60  
V
V
DS  
Gate-source voltage  
V
±20  
GSS  
DC  
I
2
6
D
Drain current  
A
1,2,5,6 : Drain  
Pulse  
I
DP  
3
4
: Gate  
: Source  
Power dissipation  
P
(Note 1)  
500  
mW  
°C  
D
Channel temperature  
Storage temperature range  
T
ch  
150  
T
55 to 150  
°C  
stg  
Note: Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the  
absolute maximum ratings.  
JEDEC  
JEITA  
TOSHIBA  
2-2T1D  
Weight: 7.0 mg (typ.)  
Please design the appropriate reliability upon reviewing the  
Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and  
individual reliability data (i.e. reliability test report and estimated failure rate, etc).  
Note 1: Mounted on FR4 board.  
2
(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 645 mm )  
1
2010-02-05  

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