是否无铅: | 不含铅 | 是否Rohs认证: | 不符合 |
生命周期: | Active | 零件包装代码: | QLCC |
包装说明: | QCCN, LCC28,.45SQ | 针数: | 28 |
Reach Compliance Code: | not_compliant | HTS代码: | 8542.39.00.01 |
Factory Lead Time: | 26 weeks | 风险等级: | 1.5 |
其他特性: | SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN | 控制类型: | ENABLE LOW |
计数方向: | UNIDIRECTIONAL | 系列: | BCT/FBT |
JESD-30 代码: | S-CQCC-N28 | 长度: | 11.43 mm |
逻辑集成电路类型: | BOUNDARY SCAN BUS DRIVER | 最大I(ol): | 0.064 A |
位数: | 4 | 功能数量: | 2 |
端口数量: | 2 | 端子数量: | 28 |
最高工作温度: | 125 °C | 最低工作温度: | -55 °C |
输出特性: | 3-STATE | 输出极性: | INVERTED |
封装主体材料: | CERAMIC, METAL-SEALED COFIRED | 封装代码: | QCCN |
封装等效代码: | LCC28,.45SQ | 封装形状: | SQUARE |
封装形式: | CHIP CARRIER | 包装方法: | TUBE |
峰值回流温度(摄氏度): | NOT SPECIFIED | 电源: | 5 V |
最大电源电流(ICC): | 52 mA | Prop。Delay @ Nom-Sup: | 9 ns |
传播延迟(tpd): | 9 ns | 认证状态: | Not Qualified |
筛选级别: | MIL-PRF-38535 | 座面最大高度: | 2.03 mm |
子类别: | Bus Driver/Transceivers | 最大供电电压 (Vsup): | 5.5 V |
最小供电电压 (Vsup): | 4.5 V | 标称供电电压 (Vsup): | 5 V |
表面贴装: | YES | 技术: | BICMOS |
温度等级: | MILITARY | 端子形式: | NO LEAD |
端子节距: | 1.27 mm | 端子位置: | QUAD |
处于峰值回流温度下的最长时间: | NOT SPECIFIED | 翻译: | N/A |
宽度: | 11.43 mm |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SNJ54BCT8240AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS | |
SNJ54BCT8244AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SNJ54BCT8244AFKR | TI |
获取价格 |
暂无描述 | |
SNJ54BCT8244AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SNJ54BCT8245AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | |
SNJ54BCT8245AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | |
SNJ54BCT8373AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | |
SNJ54BCT8373AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | |
SNJ54BCT8374AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | |
SNJ54BCT8374AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |