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SNJ54BCT8374AJT

更新时间： 2024-09-25 22:49:47
品牌 Logo 应用领域
德州仪器 - TI 触发器测试
页数 文件大小 规格书
26页 470K
描述
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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SNJ54BCT8374AJT 技术参数

生命周期：Active零件包装代码：DIP
包装说明：DIP, DIP24,.3针数：24
Reach Compliance Code：not_compliantECCN代码：EAR99
HTS代码：8542.39.00.01Factory Lead Time：6 weeks
风险等级：5.42其他特性：SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
控制类型：INDEPENDENT CONTROL计数方向：UNIDIRECTIONAL
系列：BCT/FBTJESD-30 代码：R-GDIP-T24
长度：32 mm逻辑集成电路类型：BOUNDARY SCAN BUS DRIVER
最大频率@ Nom-Sup：70000000 Hz最大I（ol）：0.064 A
位数：8功能数量：1
端口数量：2端子数量：24
最高工作温度：125 °C最低工作温度：-55 °C
输出特性：3-STATE输出极性：TRUE
封装主体材料：CERAMIC, GLASS-SEALED封装代码：DIP
封装等效代码：DIP24,.3封装形状：RECTANGULAR
封装形式：IN-LINE包装方法：TUBE
峰值回流温度（摄氏度）：NOT SPECIFIED电源：5 V
最大电源电流（ICC）：52 mAProp。Delay @ Nom-Sup：10 ns
传播延迟（tpd）：10 ns认证状态：Not Qualified
筛选级别：MIL-PRF-38535座面最大高度：5.08 mm
子类别：FF/Latches最大供电电压 (Vsup)：5.5 V
最小供电电压 (Vsup)：4.5 V标称供电电压 (Vsup)：5 V
表面贴装：NO技术：BICMOS
温度等级：MILITARY端子形式：THROUGH-HOLE
端子节距：2.54 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED翻译：N/A
触发器类型：POSITIVE EDGE宽度：6.92 mm
Base Number Matches：1

SNJ54BCT8374AJT 数据手册

 浏览型号SNJ54BCT8374AJT的Datasheet PDF文件第2页浏览型号SNJ54BCT8374AJT的Datasheet PDF文件第3页浏览型号SNJ54BCT8374AJT的Datasheet PDF文件第4页浏览型号SNJ54BCT8374AJT的Datasheet PDF文件第5页浏览型号SNJ54BCT8374AJT的Datasheet PDF文件第6页浏览型号SNJ54BCT8374AJT的Datasheet PDF文件第7页 
SN54BCT8374A, SN74BCT8374A  
SCAN TEST DEVICES  
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS  
SCBS045E – JUNE 1990 – REVISED JULY 1996  
SN54BCT8374A . . . JT PACKAGE  
SN74BCT8374A . . . DW OR NT PACKAGE  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
(TOP VIEW)  
Octal Test-Integrated Circuits  
CLK  
1Q  
2Q  
3Q  
4Q  
GND  
5Q  
6Q  
OE  
1D  
2D  
3D  
4D  
5D  
V
1
2
3
4
5
6
7
8
9
24  
23  
22  
21  
20  
19  
18  
17  
16  
Functionally Equivalent to ’F374 and  
’BCT374 in the Normal-Function Mode  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
Test Operation Synchronous to Test  
Access Port (TAP)  
CC  
6D  
7D  
Implement Optional Test Reset Signal by  
Recognizing a Double-High-Level Voltage  
(10 V) on TMS Pin  
7Q  
8Q 10  
15 8D  
TDO  
TMS  
TDI  
TCK  
11  
12  
14  
13  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP,  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
SN54BCT8374A . . . FK PACKAGE  
(TOP VIEW)  
– Sample Inputs/Toggle Outputs  
4
3
2
1
28 27 26  
25  
5
6
7
8
9
2D  
1D  
OE  
NC  
CLK  
1Q  
8D  
TDI  
TCK  
Package Options Include Plastic  
24  
23  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Plastic  
(NT) and Ceramic (JT) 300-mil DIPs  
22 NC  
21 TMS  
20 TDO  
19 8Q  
10  
11  
description  
2Q  
12 13 14 15 16 17 18  
The ’BCT8374A scan test devices with octal  
edge-triggered D-type flip-flops are members of  
the Texas Instruments SCOPE  
testability  
integrated-circuit family. This family of devices  
supports IEEE Standard 1149.1-1990 boundary  
scan to facilitate testing of complex circuit-board  
assemblies. Scan access to the test circuitry is  
accomplished via the 4-wire test access port  
(TAP) interface.  
NC – No internal connection  
In the normal mode, these devices are functionally equivalent to the ’F374 and ’BCT374 octal D-type flip-flops.  
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device  
terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect  
the functional operation of the SCOPE octal flip-flops.  
In the test mode, the normal operation of the SCOPE octal flip-flops is inhibited and the test circuitry is enabled  
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform  
boundary-scan test operations as described in IEEE Standard 1149.1-1990.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE is a trademark of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...26

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SNJ54BCT8374AJT 替代型号

型号 品牌 替代类型 描述 数据表
SN74BCT8374ADW TI

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 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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SN74BCT8374ANT TI

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 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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