生命周期: | Obsolete | 零件包装代码: | QFN |
包装说明: | QCCN, | 针数: | 28 |
Reach Compliance Code: | unknown | HTS代码: | 8542.39.00.01 |
风险等级: | 5.56 | 其他特性: | WITH DIRECTION CONTROL |
系列: | BCT/FBT | JESD-30 代码: | S-CQCC-N28 |
长度: | 11.43 mm | 逻辑集成电路类型: | BOUNDARY SCAN BUS TRANSCEIVER |
位数: | 8 | 功能数量: | 1 |
端口数量: | 2 | 端子数量: | 28 |
最高工作温度: | 125 °C | 最低工作温度: | -55 °C |
输出特性: | 3-STATE | 输出极性: | TRUE |
封装主体材料: | CERAMIC, METAL-SEALED COFIRED | 封装代码: | QCCN |
封装形状: | SQUARE | 封装形式: | CHIP CARRIER |
最大电源电流(ICC): | 52 mA | 传播延迟(tpd): | 11 ns |
认证状态: | Not Qualified | 筛选级别: | MIL-PRF-38535 |
座面最大高度: | 2.03 mm | 最大供电电压 (Vsup): | 5.5 V |
最小供电电压 (Vsup): | 4.5 V | 标称供电电压 (Vsup): | 5 V |
表面贴装: | YES | 技术: | BICMOS |
温度等级: | MILITARY | 端子形式: | NO LEAD |
端子节距: | 1.27 mm | 端子位置: | QUAD |
宽度: | 11.43 mm |
型号 | 品牌 | 替代类型 | 描述 | 数据表 |
SN74BCT8245ADWRG4 | TI |
完全替代 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | |
SN74BCT8245ADWRE4 | TI |
完全替代 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | |
SN74BCT8245ANTE4 | TI |
完全替代 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SNJ54BCT8373AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | |
SNJ54BCT8373AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | |
SNJ54BCT8374AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | |
SNJ54BCT8374AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | |
SNJ54CBT16209WD | TI |
获取价格 |
18-BIT FET BUS-EXCHANGE SWITCHES | |
SNJ54CBT16212AWD | TI |
获取价格 |
24-BIT FET BUS-EXCHANGE SWITCHES | |
SNJ54CBT16244WD | TI |
获取价格 |
16-BIT FET BUS SWITCHES | |
SNJ54CBT3383JT | TI |
获取价格 |
10-BIT FET BUS-EXCHANGE SWITCHES | |
SNJ54CBT3383W | TI |
获取价格 |
10-BIT FET BUS-EXCHANGE SWITCHES | |
SNJ54CBTD3384 | TI |
获取价格 |
10-BIT FET BUS SWITCHES WITH LEVEL SHIFTING |