SN74LVC2G17
www.ti.com ............................................................................................................................................... SCES381I–JANUARY 2002–REVISED OCTOBER 2009
DUAL SCHMITT-TRIGGER BUFFER
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FEATURES
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Available in the Texas Instruments NanoFree™
Package
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Typical VOHV (Output VOH Undershoot)
>2 V at VCC = 3.3 V, TA = 25°C
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Supports 5-V VCC Operation
Ioff Supports Partial-Power-Down Mode
Operation
Inputs Accept Voltages to 5.5 V
Max tpd of 5.4 ns at 3.3 V
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
Low Power Consumption, 10-µA Max ICC
±24-mA Output Drive at 3.3 V
ESD Protection Exceeds JESD 22
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2000-V Human-Body Model (A114-A)
1000-V Charged-Device Model (C101)
Typical VOLP (Output Ground Bounce)
<0.8 V at VCC = 3.3 V, TA = 25°C
DBV PACKAGE
(TOP VIEW)
DCK PACKAGE
(TOP VIEW)
YZP PACKAGE
(BOTTOM VIEW)
3
2
1
4
5
6
2A
GND
1A
2Y
1
2
3
6
5
4
1A
GND
2A
1Y
1
2
3
6
5
4
1A
GND
2A
1Y
VCC
VCC
1Y
VCC
2Y
2Y
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This dual Schmitt-trigger buffer is designed for 1.65-V to 5.5-V VCC operation.
The SN74LVC2G17 contains two buffers and performs the Boolean function Y = A. The device functions as two
independent buffers, but because of Schmitt action, it may have different input threshold levels for positive-going
(VT+) and negative-going (VT–) signals.
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2009, Texas Instruments Incorporated