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SN74HC165-EP PDF预览

SN74HC165-EP

更新时间: 2024-11-01 11:58:23
品牌 Logo 应用领域
德州仪器 - TI 移位寄存器
页数 文件大小 规格书
16页 632K
描述
8-BIT PARALLEL-LOAD SHIFT REGISTER

SN74HC165-EP 数据手册

 浏览型号SN74HC165-EP的Datasheet PDF文件第2页浏览型号SN74HC165-EP的Datasheet PDF文件第3页浏览型号SN74HC165-EP的Datasheet PDF文件第4页浏览型号SN74HC165-EP的Datasheet PDF文件第5页浏览型号SN74HC165-EP的Datasheet PDF文件第6页浏览型号SN74HC165-EP的Datasheet PDF文件第7页 
ꢀꢁ ꢂꢃ ꢄꢅ ꢆꢇ ꢈꢉ ꢊꢋ  
ꢌ ꢉꢍꢎ ꢏ ꢋꢐꢑꢐ ꢒꢒ ꢊꢒ ꢉꢒ ꢓ ꢐꢔ ꢀꢄ ꢎꢕ ꢏ ꢑꢊ ꢖ ꢎꢀ ꢏꢊ ꢑ  
SCLS473A − APRIL 2003 − REVISED JANUARY 2004  
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
D
D
D
D
D
4-mA Output Drive at 5 V  
Low Input Current of 1 µA Max  
Complementary Outputs  
D
D
Extended Temperature Performance of Up  
To −55°C to 125°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Direct Overriding Load (Data) Inputs  
Gated Clock Inputs  
Parallel-to-Serial Data Conversion  
D
D
D
D
D
D
Enhanced Product-Change Notification  
D OR PW PACKAGE  
(TOP VIEW)  
Qualification Pedigree  
2-V to 6-V V  
Operation  
CC  
SH/LD  
CLK  
E
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
V
CC  
CLK INH  
Outputs Can Drive Up To 10 LSTTL Loads  
Low Power Consumption, 80-µA Max I  
CC  
D
C
B
A
Typical t = 13 ns  
pd  
F
G
H
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
Q
SER  
H
GND  
Q
H
description/ordering information  
The SN74HC165 is an 8-bit parallel-load shift register that, when clocked, shifts the data toward a serial (Q )  
H
output. Parallel-in access to each stage is provided by eight individual direct data (A−H) inputs that are enabled  
by a low level at the shift/load (SH/LD) input. The SN74HC165 device also features a clock-inhibit (CLK INH)  
function and a complementary serial (Q ) output.  
H
Clocking is accomplished by a low-to-high transition of the clock (CLK) input while SH/LD is held high and CLK  
INH is held low. The functions of CLK and CLK INH are interchangeable. Since a low CLK and a low-to-high  
transition of CLK INH also accomplish clocking, CLK INH should be changed to the high level only while CLK  
is high. Parallel loading is inhibited when SH/LD is held high. While SH/LD is low, the parallel inputs to the  
register are enabled independently of the levels of the CLK, CLK INH, or serial (SER) inputs.  
ORDERING INFORMATION  
ORDERABLE  
PART NUMBER  
TOP-SIDE  
MARKING  
PACKAGE  
T
A
SOIC − D  
Tape and reel  
Tape and reel  
Tape and reel  
SN74HC165QDREP  
SN74HC165QPWREP  
SN74HC165MDREP  
HC165EP  
−40°C to 125°C  
−55°C to 125°C  
TSSOP − PW  
SOIC − D  
HC165EP  
HC165MEP  
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are  
available at www.ti.com/sc/package.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
ꢏꢣ  
Copyright 2004, Texas Instruments Incorporated  
ꢟ ꢣ ꢠ ꢟꢘ ꢙꢭ ꢛꢚ ꢞ ꢦꢦ ꢤꢞ ꢜ ꢞ ꢝ ꢣ ꢟ ꢣ ꢜ ꢠ ꢨ  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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