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SN74ALVCH16374KR PDF预览

SN74ALVCH16374KR

更新时间： 2024-11-21 05:29:35
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器触发器逻辑集成电路输出元件
页数 文件大小 规格书
14页 318K
描述
16-BIT EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS

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SN74ALVCH16374KR 技术参数

是否无铅： 含铅是否Rohs认证： 不符合
生命周期：Obsolete零件包装代码：BGA
包装说明：VFBGA-56针数：56
Reach Compliance Code：not_compliantHTS代码：8542.39.00.01
Factory Lead Time：1 week风险等级：7.63
Is Samacsys：N系列：ALVC/VCX/A
JESD-30 代码：R-PBGA-B56JESD-609代码：e0
长度：7 mm负载电容（CL）：30 pF
逻辑集成电路类型：BUS DRIVER最大频率@ Nom-Sup：150000000 Hz
最大I（ol）：0.024 A湿度敏感等级：1
位数：8功能数量：2
端口数量：2端子数量：56
最高工作温度：85 °C最低工作温度：-40 °C
输出特性：3-STATE输出极性：TRUE
封装主体材料：PLASTIC/EPOXY封装代码：VFBGA
封装等效代码：BGA56,6X10,25封装形状：RECTANGULAR
封装形式：GRID ARRAY, VERY THIN PROFILE, FINE PITCH包装方法：TAPE AND REEL
峰值回流温度（摄氏度）：240电源：3.3 V
Prop。Delay @ Nom-Sup：4.2 ns传播延迟（tpd）：5.3 ns
认证状态：Not Qualified座面最大高度：1 mm
子类别：FF/Latches最大供电电压 (Vsup)：3.6 V
最小供电电压 (Vsup)：1.65 V标称供电电压 (Vsup)：1.8 V
表面贴装：YES技术：CMOS
温度等级：INDUSTRIAL端子面层：Tin/Lead (Sn/Pb)
端子形式：BALL端子节距：0.65 mm
端子位置：BOTTOM处于峰值回流温度下的最长时间：NOT SPECIFIED
触发器类型：POSITIVE EDGE宽度：4.5 mm
Base Number Matches：1

SN74ALVCH16374KR 数据手册

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SN74ALVCH16374  
16-BIT EDGE-TRIGGERED D-TYPE FLIP-FLOP  
WITH 3-STATE OUTPUTS  
www.ti.com  
SCES021L–JULY 1995–REVISED SEPTEMBER 2004  
FEATURES  
DGG, DGV, OR DL PACKAGE  
(TOP VIEW)  
•
Member of the Texas Instruments Widebus™  
Family  
1CLK  
1D1  
1D2  
GND  
1D3  
1D4  
1OE  
1Q1  
1Q2  
GND  
1Q3  
1Q4  
1
2
3
4
5
6
7
8
9
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
•
•
•
•
Operates From 1.65 to 3.6 V  
Max tpd of 4.2 ns at 3.3 V  
±24-mA Output Drive at 3.3 V  
Bus Hold on Data Inputs Eliminates the Need  
for External Pullup/Pulldown Resistors  
•
•
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
V
CC  
V
CC  
1D5  
1D6  
GND  
1D7  
1D8  
2D1  
2D2  
GND  
2D3  
2D4  
1Q5  
1Q6  
GND 10  
1Q7  
1Q8  
2Q1  
ESD Protection Exceeds JESD 22  
– 2000-V Human-Body Model (A114-A)  
– 200-V Machine Model (A115-A)  
11  
12  
13  
DESCRIPTION/ORDERING INFORMATION  
2Q2 14  
GND 15  
2Q3 16  
2Q4 17  
This 16-bit edge-triggered D-type flip-flop is designed  
for 1.65-V to 3.6-V VCC operation.  
The SN74ALVCH16374 is particularly suitable for  
implementing buffer registers, I/O ports, bidirectional  
bus drivers, and working registers. It can be used as  
two 8-bit flip-flops or one 16-bit flip-flop. On the  
positive transition of the clock (CLK) input, the  
Q outputs of the flip-flop take on the logic levels at  
the data (D) inputs. OE can be used to place the  
eight outputs in either a normal logic state (high or  
low logic levels) or the high-impedance state. In the  
high-impedance state, the outputs neither load nor  
drive the bus lines significantly. The high-impedance  
state and the increased drive provide the capability to  
drive bus lines without need for interface or pullup  
components.  
V
CC  
V
CC  
18  
2D5  
2D6  
GND  
2D7  
2D8  
2CLK  
2Q5 19  
2Q6 20  
GND 21  
2Q7 22  
2Q8 23  
2OE 24  
OE does not affect internal operations of the flip-flop. Old data can be retained or new data can be entered while  
the outputs are in the high-impedance state.  
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup  
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.  
Active bus-hold circuitry holds unused or undriven inputs at a valid logic state. Use of pullup or pulldown resistors  
with the bus-hold circuitry is not recommended.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Widebus is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 1995–2004, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
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