Datasheet > SN54F20_14

SN54F20_14

更新时间： 2024-09-14 02:58:47

品牌	Logo	应用领域
德州仪器 - TI		输入元件
页数	文件大小	规格书
5页	70K
描述
DUAL 4-INPUT POSITIVE-NAND GATES

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SN54F20_14 数据手册

SN54F20, SN74F20

DUAL 4-INPUT POSITIVE-NAND GATES

SDFS041A – MARCH 1987 – REVISED OCTOBER 1993

SN54F20 . . . J PACKAGE

SN74F20 . . . D OR N PACKAGE

(TOP VIEW)

• Package Options Include Plastic

Small-Outline Packages, Ceramic Chip

Carriers, and Standard Plastic and Ceramic

300-mil DIPs

description

These devices contain two independent 4-input

NAND gates. They perform the Boolean functions

Y = A • B • C • D or Y = A + B + C + D in positive

logic.

GND

The SN54F20 is characterized for operation over

the full military temperature range of –55°C to

125°C. The SN74F20 is characterized for

operation from 0°C to 70°C.

SN54F20 . . . FK PACKAGE

(TOP VIEW)

FUNCTION TABLE

(each gate)

20 19

INPUTS

OUTPUT

9 10 11 12 13

NC – No internal connection

†

logic symbol

†

This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.

Pin numbers shown are for the D, J, and N packages.

logic diagram, each gate (positive logic)

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

2–1

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5

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