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SG50N06DS PDF预览

SG50N06DS

更新时间: 2022-04-06 15:52:32
品牌 Logo 应用领域
SIRECTIFIER 晶体双极型晶体管双极性晶体管
页数 文件大小 规格书
2页 158K
描述
绝缘栅双极型晶体管(IGBT)Isolated Gate Bipolar Transistor (IGBTs),IGBT分立器件Discrete IGBTs。

SG50N06DS 数据手册

 浏览型号SG50N06DS的Datasheet PDF文件第1页 
SG50N06S, SG50N06DS  
Discrete IGBTs  
(T  
J
=25o  
C, unless otherwise specified)  
Characteristic Values  
Symbol  
Test Conditions  
Unit  
min.  
25  
typ.  
max.  
gts  
I
C=IC90; VCE=10V  
35  
S
Pulse test, t 300us, duty cycle 2%  
C
ies  
4000  
340  
100  
110  
30  
C
oes  
V
CE=25V; VGE=0V; f=1MHz  
pF  
nC  
C
res  
Q
g
ge  
gc  
180  
50  
Q
Q
IC=IC90; VGE=15V; VCE=0.5VCES  
40  
100  
t
d(on)  
ri  
d(off)  
fi  
off  
d(on)  
ri  
Inductive load, T  
=IC90; VGE=15V; L=100uH  
CE=0.8VCES'; R =Roff=2.7  
J
=25o  
C
50  
ns  
ns  
t
I
C
30  
V
G
t
200  
150  
3
ns  
Remarks:Switching times may increase  
for VCE(Clamp) 0.8VCES' higher T or  
increased R  
t
ns  
J
E
G
mJ  
ns  
t
Inductive load, T  
=IC90; VGE=15V; L=100uH  
CE=0.8VCES'; R =Roff=2.7  
J
=125o  
C
50  
t
I
C
25  
ns  
E
on  
V
G
3
mJ  
ns  
t
d(off)  
Remarks:Switching times may increase  
for VCE(Clamp) 0.8VCES' higher T or  
increased R  
280  
250  
4.2  
t
fi  
J
ns  
E
off  
G
mJ  
K/W  
K/W  
R
thJC  
0.50  
R
thCK  
0.05  
(T  
J
=25o  
C, unless otherwise specified)  
Reverse Diode (FRED)  
Symbol  
Characteristic Values  
Test Conditions  
Unit  
min.  
typ.  
max.  
V
F
I
F
=60A; TVJ=150o  
C
1.75  
2.40  
V
Pulse test, t 300us, duty cycle d 2%; TVJ=25o  
C
I
R
T
T
VJ=25oC; VR=VRRM  
650  
2.5  
uA  
mA  
VJ=150o  
C
I
RM  
rr  
thJC  
I
I
F
=IC90; VGE=0V; -di  
F
/dt=100A/us; V  
R
=540V  
8.0  
A
=25o  
t
35  
ns  
F=1A; -di/dt=50A/us; V  
R
=30V; T C  
J
R
0.85  
K/W  

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